Inventor
Mark H. Van Benthem
Inventor
Albuquerque, NM, US
Overview
Patents· 4 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties38%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light25%
G06FElectric digital data processing25%
G06VImage or video recognition or understanding13%
PatentTitleYear
10,551,247Global analysis peak fitting for chemical spectroscopy data20208,266,197'Method for factor analysis of GC/MS data'20127,491,944'Method to analyze remotely sensed spectral data'20097,451,173'Fast combinatorial algorithm for the solution of linearly constrained least squares problems'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2012Patents assigned to SANDIA CORP (3)· patent assignee history
2008–2009Based in Middletown, DE, US· patent location history
2012Patents assigned to KEENAN MICHAEL R (1)· patent assignee history
2012Patents assigned to KOTULA PAUL G (1)· patent assignee history
2012Patents assigned to VAN BENTHEM MARK H (1)· patent assignee history
2012–2020Based in Albuquerque, NM, US· patent location history
2020Patents assigned to NAT TECH & ENG SOLUTIONS SANDIA LLC (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SANDIA CORP | 3 | 2008–2012 |
| KEENAN MICHAEL R | 1 | 2012 |
| KOTULA PAUL G | 1 | 2012 |
| NAT TECH & ENG SOLUTIONS SANDIA LLC | 1 | 2020 |
| VAN BENTHEM MARK Hself | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Albuquerque, NM, US | 2 | 2012–2020 |
| Middletown, Delaware, US | 2 | 2008–2009 |