Inventor
Jerzy Lobacz
Inventor
San Mateo, CA, US
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables60%
H05KPrinted circuits30%
Y10TTechnical subjects covered by former us classification10%
PatentTitleYear
7,928,754'Wafer level burn-in and electrical test system and method'20117,619,428'Wafer level burn-in and electrical test system and method'20096,682,945'Wafer level burn-in and electrical test system and method'20046,580,283'Wafer level burn-in and test methods'20035,884,395'Assembly structure for making integrated circuit chip probe cards'19995,742,174'Membrane for holding a probe tip in proper location'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–1999Patents assigned to PROBE TECHNOLOGY (2)· patent assignee history
1998–2011Based in San Mateo, CA, US· patent location history
2003–2011Patents assigned to AEHR TEST SYSTEMS (4)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AEHR TEST SYSTEMS | 4 | 2003–2011 |
| PROBE TECHNOLOGY | 2 | 1998–1999 |
Locations
| Location | Patents | Span |
|---|---|---|
| San Mateo, California, US | 6 | 1998–2011 |