Inventor

Warren K. Harwood

Inventor

Vancouver, WA, US

Overview

1989–2009

Patent span

Physics

Primary field (CPC G)

Patents· 26 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary

G01RMeasuring electric variables35%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1033%

A46DManufacture of brushes30%

H01PWaveguides1%

PatentTitleYear

7,595,632'Wafer probe station having environment control enclosure'2009 7,589,518'Wafer probe station having a skirting component'2009 7,492,147'Wafer probe station having a skirting component'2009 7,348,787'Wafer probe station having environment control enclosure'2008 7,330,023'Wafer probe station having a skirting component'2008 7,009,383'Wafer probe station having environment control enclosure'2006 6,980,012'Wafer probe station for low-current measurements'2005 6,801,047'Wafer probe station having environment control enclosure'2004 6,720,782'Wafer probe station for low-current measurements'2004 6,636,059'Wafer probe station having environment control enclosure'2003 6,492,822'Wafer probe station for low-current measurements'2002 6,486,687'Wafer probe station having environment control enclosure'2002 6,380,751'Wafer probe station having environment control enclosure'2002 6,335,628'Wafer probe station for low-current measurements'2002 6,313,649'Wafer probe station having environment control enclosure'2001 6,232,788'Wafer probe station for low-current measurements'2001 5,663,653'Wafer probe station for low-current measurements'1997 5,604,444'Wafer probe station having environment control enclosure'1997 5,532,609'Wafer probe station having environment control enclosure'1996 5,457,398'Wafer probe station having full guarding'1995 5,434,512'Wafer probe station having integrated guarding, Kelvin connection and shielding systems'1995 5,345,170'Wafer probe station having integrated guarding, Kelvin connection and shielding systems'1994 5,266,889'Wafer probe station with integrated environment control enclosure'1993 5,237,267'Wafer probe station having auxiliary chucks'1993 4,961,050'Test fixture for microstrip assemblies'1990 4,855,697'Coaxial transmission line to microstrip transmission line launcher'1989

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1989–2009Patents assigned to CASCADE MICROTECH INC (25)· patent assignee history

1989–2009Based in Vancouver, WA, US· patent location history

2005Patents assigned to CASCASE MICROTECH INC (1)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
CASCADE MICROTECH INC	25	1989–2009
CASCASE MICROTECH INC	1	2005

Locations

Location	Patents	Span
Vancouver, Washington, US	26	1989–2009