Inventor
Toshifumi Watanabe
Inventor
Tokyo, JP
Overview
Patents· 41 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Gprimary
G03GElectrography14%
H01LSemiconductor devices11%
G11CStatic stores8%
G01RMeasuring electric variables7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
A61KPreparations for medical, dental or toiletry purposes6%
B24BMachines, devices, or processes for grinding or polishing6%
C07DHeterocyclic compounds6%
H10HInorganic light-emitting semiconductor devices having potential barriers4%
C07KPeptides3%
PatentTitleYear
10,872,673Semiconductor memory device202010,835,876Gas-dissolved liquid producing apparatus202010,811,284Substrate processing method and apparatus202010,734,562Method for manufacturing substrate terminal board for mounting semiconductor element202010,632,587Polishing apparatus and polishing method202010,580,501Semiconductor memory device202010,444,691Image forming apparatus and control program20199,905,521'Method for manufacturing semiconductor light-emitting device and semiconductor light-emitting device'20189,604,335'Wafer polishing apparatus'20179,399,274'Wafer polishing method'20168,649,234'Semiconductor memory device'20148,259,523'Semiconductor memory device'20128,223,569'Semiconductor memory device'20128,189,424'Semiconductor memory device having plurality of types of memories integrated on one chip'20127,577,058'Semiconductor device having input detection circuit which operates in a synchronous operation and an asynchronous operation'20097,076,135'Optical module and manufacturing method therefor'20066,911,678'Glass-sealed light-emitting diode'20056,795,496'Jitter measuring device and method'20046,775,321'Apparatus for and method of measuring a jitter'20046,687,629'Apparatus for and method of measuring a jitter'20046,525,523'Jitter measurement apparatus and its method'20036,522,122'Jitter measuring device and method'20036,285,839'Image forming apparatus having function for automatically adjusting image forming condition'20016,249,656'Image forming apparatus that reduces test toner cleaning'20016,147,051'Methods and compositions for the prophylactic and/or therapeutic treatment of organ hypofunction'20006,140,325'Thienopyrimidine derivatives, their production and use'20006,021,288'Image forming apparatus'20005,978,615'Tandem-type image forming apparatus and image forming condition determination method used in this tandem-type image forming apparatus'19995,925,731'Endothelin antagonist peptides'19995,891,895'Hydroxypyridine derivatives their production and use'19995,860,041'Device for measuring toner concentration in developer comprising toner and carrier'19995,822,079'Digital image forming apparatus with test image optimization'19985,753,619'Composition for prophylaxis or treatment of pulmonary circulatory diseases'19985,716,971'Pyridine derivatives, their production and use'19985,708,918'Image formation apparatus that can maintain appropriately toner density in developing device'19985,694,223'Digital image forming apparatus which specifies a sensitivity characteristic of a photoconductor'19975,581,221'Electrophotographic image forming apparatus'19965,555,318'Thresholding method for segmenting gray scale image, method for determining background concentration distribution, and image displacement detection method'19965,506,917'Thresholding method for segmenting gray scale image, method for determining background concentration distribution, and image displacement detection method'19965,364,684'Magnetic recording medium comprising a polyethylene-2,6-naphthalate multilayered film coated on both sides by a coating layer'19945,270,308'1,3-benzoxazine derivatives, their production and use'1993Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1993–2000Patents assigned to TAKEDA CHEMICAL INDUSTRIES LTD (6)· patent assignee history
1993–2000Based in Kawachinagano, JP· patent location history
1996–2001Patents assigned to MINOLTA CO LTD (9)· patent assignee history
1997–2001Based in Toyohashi, JP· patent location history
1998–2000Based in Osaka, JP· patent location history
2003–2004Patents assigned to ADVANTEST CORP (5)· patent assignee history
2003–2020Based in Tokyo, JP· patent location history
2009–2014Patents assigned to TOSHIBA KK (5)· patent assignee history
2009–2020Based in Yokohama, JP· patent location history
2016–2020Patents assigned to EBARA CORP (5)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MINOLTA CO LTD | 9 | 1996–2001 |
| TAKEDA CHEMICAL INDUSTRIES LTD | 6 | 1993–2000 |
| ADVANTEST CORP | 5 | 2003–2004 |
| EBARA CORP | 5 | 2016–2020 |
| TOSHIBA KK | 5 | 2009–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 13 | 2003–2020 |
| Yokohama, JP | 7 | 2009–2020 |
| Toyohashi, JP | 6 | 1997–2001 |
| Osaka, JP | 3 | 1998–2000 |
| Kawachinagano, JP | 3 | 1993–2000 |