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Inventor

Jiahui Pan

Inventor
Beijing, CN

Overview

2→
Patents
2008–2021
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions33%
G06TImage data processing or generation, in general33%
H04LTransmission of digital information, e.g. telegraphic communication33%
PatentTitleYear
10,999,129Fault detection method, apparatus, and system in NFV system20217,369,253'Systems and methods for measuring sample surface flatness of continuously moving samples'2008

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2008Patents assigned to AKROMETRIX LLC (1)· patent assignee history
2008Based in Atlanta, GA, US· patent location history
2021Patents assigned to HUAWEI TECH CO LTD (1)· patent assignee history
2021Based in Beijing, CN· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
AKROMETRIX LLC12008
HUAWEI TECH CO LTD12021
Locations
LocationPatentsSpan
Beijing, CN12021
Atlanta, Georgia, US12008