Inventor
Herbert Goebel
Inventor
Reutlingen, DE
Overview
Patents· 21 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties14%
H10DInorganic electric semiconductor devices14%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests9%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h107%
G01FMeasuring volume, volume flow, mass flow or liquid level5%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure5%
G21KHandling of particles or ionising radiation not otherwise provided for5%
A61KPreparations for medical, dental or toiletry purposes2%
A61NElectrotherapy2%
PatentTitleYear
7,068,754'System to generate therapeutic radiation'20067,012,026'Method for producing defined polycrystalline silicon areas in an amorphous silicon layer'20066,716,714'Semiconductor diode and method for producing the same'20046,667,683'Planar trimming resistor, applications and method for its manufacture'20036,368,932'Method for producing diodes'20026,240,777'Sensor having a membrane'20016,226,349'X-ray analysis apparatus with a graded multilayer mirror'20016,101,872'Sensor having a thin film element'20005,766,973'Method for manufacturing a semiconductor arrangement by introducing crystal disorder structures and varying diffusion rates'19985,759,909'Method for manufacturing a silicon wafer by using a dopant foil'19985,710,463'High-voltage breakover diode'19985,691,892'Rectifier arrangement for a three-phase generator'19975,686,319'Method for producing a diode'19975,541,140'Semiconductor arrangement and method for its manufacture'19965,393,711'Process for manufacturing semiconductor components'19955,373,544'X-ray diffractometer'19945,234,865'Method of soldering together two components'19935,169,472'Method of making a multi-layer silicon structure'19924,301,364'X-Ray diffractometer with high time resolution'19814,274,000'X-ray powder diffractometer'19814,144,450'X-ray powder diffractometer'1979Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1979–1994Patents assigned to SIEMENS AG (4)· patent assignee history
1979Based in Graefelfing, DE· patent location history
1981–2006Based in Munich, DE· patent location history
1992–2006Patents assigned to BOSCH GMBH ROBERT (15)· patent assignee history
1992–2006Based in Reutlingen, DE· patent location history
1995Based in Ruetlingen, DE· patent location history
1998Based in Spitzaeckerweg, DE· patent location history
2001Patents assigned to BRUKER AXS ANALYTICAL X RAY SY (1)· patent assignee history
2001Patents assigned to GEESTHACHT GKSS FORSCHUNG (1)· patent assignee history
2006Patents assigned to SIEMENS MEDICAL SOLUTIONS (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| BOSCH GMBH ROBERT | 15 | 1992–2006 |
| SIEMENS AG | 4 | 1979–1994 |
| BRUKER AXS ANALYTICAL X RAY SY | 1 | 2001 |
| GEESTHACHT GKSS FORSCHUNG | 1 | 2001 |
| SIEMENS MEDICAL SOLUTIONS | 1 | 2006 |
Locations
| Location | Patents | Span |
|---|---|---|
| Reutlingen, DE | 13 | 1992–2006 |
| Munich, DE | 5 | 1981–2006 |
| Spitzaeckerweg, DE | 1 | 1998 |
| Ruetlingen, DE | 1 | 1995 |
| Graefelfing, DE | 1 | 1979 |