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Inventor

Ayumu Onoyama

Inventor
Tokyo, JP

Overview

3→
Patents
2004–2013
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
G06TImage data processing or generation, in general25%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1025%
PatentTitleYear
8,435,417'Method of manufacturing semiconductor device'20137,065,238'Defect inspection method and defect inspection equipment'20066,829,047'Defect detection system'2004

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2004–2013Patents assigned to MITSUBISHI ELECTRIC CORP (3)· patent assignee history
2004–2006Based in Tokyo, JP· patent location history
2013Patents assigned to FUJII RYOICHI (1)· patent assignee history
2013Patents assigned to HIRATA TOMOYA (1)· patent assignee history
2013Patents assigned to HONDA SHIGETO (1)· patent assignee history
2013Patents assigned to MOTONAMI KAORU (1)· patent assignee history
2013Based in Chiyoda-ku, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MITSUBISHI ELECTRIC CORP32004–2013
FUJII RYOICHI12013
HIRATA TOMOYA12013
HONDA SHIGETO12013
MOTONAMI KAORU12013
Locations
LocationPatentsSpan
Tokyo, JP22004–2006
Chiyoda-ku, JP12013