Inventor
Ken Mochizuki
Inventor
Atsugi, JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables23%
H04LTransmission of digital information, e.g. telegraphic communication23%
G03GElectrography18%
G06FElectric digital data processing9%
B01DSeparation5%
C21BManufacture of iron or steel5%
F28CHeat-exchange apparatus, not provided for in another subclass, in which the heat-exchange media come into direct contact without chemical interaction5%
G04FTime-interval measuring5%
H04JMultiplex communication5%
Y02PClimate change mitigation technologies in the production or processing of goods5%
PatentTitleYear
11,022,917Image heating apparatus202110,969,712Image heating apparatus and image forming apparatus that control electrical power supplied to first and second heat generating blocks202110,908,541Image heating apparatus which attains secure fixing of an unfixed image and reduction of energy to be consumed while securing slidability of a film202110,901,349Image forming apparatus and image heating apparatus for controlling a heat generating quantity of a plurality of heating elements202110,234,483Sampling circuit, sampling method, sampling oscilloscope, and waveform display method20198,855,182'Optimization method of optimally setting emphasis and optimization device for optimally setting emphasis'20148,432,958'Apparatus for measuring jitter transfer characteristic'20138,208,586'Jitter measuring apparatus'20127,574,311'Time interval measuring apparatus and jitter measuring apparatus using the same'20097,450,633'Wander generator, and digital line tester and phase noise transfer characteristic analyzer using the same'20087,248,981'Jitter measurement device and jitter measurement method'20077,206,339'Wonder generator, digital line tester comprising the same, and phase noise transfer characteristic analyzer'20076,972,603'Maximum time interval error test signal generating apparatus not affected by low-pass measuring filter'20054,642,127'Method for cooling blast furnace gas in an heat recovery system'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987Based in Kitakyushu, JP· patent location history
2005–2019Patents assigned to ANRITSU CORP (9)· patent assignee history
2005–2014Based in Atsugi, JP· patent location history
2012–2014Patents assigned to MOCHIZUKI KEN (3)· patent assignee history
2012–2013Patents assigned to SUZUKI SEIYA (2)· patent assignee history
2012Based in Agsugi, JP· patent location history
2013Patents assigned to AOKI TAKASHI (1)· patent assignee history
2019Based in Kanagawa, JP· patent location history
2021Patents assigned to CANON KK (4)· patent assignee history
2021Based in Suntou-gun, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ANRITSU CORP | 9 | 2005–2019 |
| CANON KK | 4 | 2021 |
| MOCHIZUKI KENself | 3 | 2012–2014 |
| SUZUKI SEIYA | 2 | 2012–2013 |
| AOKI TAKASHI | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Atsugi, JP | 7 | 2005–2014 |
| Suntou-gun, JP | 4 | 2021 |
| Kanagawa, JP | 1 | 2019 |
| Agsugi, JP | 1 | 2012 |
| Kitakyushu, JP | 1 | 1987 |