Inventor
Toyoji Yamamoto
Inventor
Tokyo, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Dprimary
H10DInorganic electric semiconductor devices36%
H01LSemiconductor devices18%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light9%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
G11CStatic stores9%
H10BElectronic memory devices9%
H10NElectric solid-state devices not otherwise provided for9%
PatentTitleYear
9,553,131'Semiconductor device and forming method'20178,900,973'Method to enable compressively strained pFET channel in a FinFET structure by implant and thermal diffusion'20146,933,569'SOI MOSFET'20056,459,126'Semiconductor device including a MIS transistor'20025,770,494'Process of fabricating semiconductor device having gate structure doped through diffusion from refractory metal silicide into polysilicon'19984,482,245'Apparatus for measuring the color of a brilliant-cut diamond'1984Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1984Patents assigned to KALNEW OPTICAL IND (1)· patent assignee history
1984Based in Tokorozawa, JP· patent location history
1998–2005Patents assigned to NEC CORP (3)· patent assignee history
1998–2005Based in Tokyo, JP· patent location history
2014Patents assigned to BERLINER NATHANIEL C (1)· patent assignee history
2014Patents assigned to GLOBALFOUNDRIES INC (1)· patent assignee history
2014Patents assigned to IBM (1)· patent assignee history
2014Based in Yokohama, JP· patent location history
2017Based in Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NEC CORP | 3 | 1998–2005 |
| BERLINER NATHANIEL C | 1 | 2014 |
| GLOBALFOUNDRIES INC | 1 | 2014 |
| IBM | 1 | 2014 |
| KALNEW OPTICAL IND | 1 | 1984 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 3 | 1998–2005 |
| Kanagawa, JP | 1 | 2017 |
| Yokohama, JP | 1 | 2014 |
| Tokorozawa, JP | 1 | 1984 |