Inventor
Gilad Almogy
Inventor
Palo Alto, CA, US
Overview
Patents· 77 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties13%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation9%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution9%
H01LSemiconductor devices8%
H02SGeneration of electric power by conversion of infrared radiation, visible light or ultraviolet light, e.g. using photovoltaic [pv] modules7%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices6%
Y02BClimate change mitigation technologies related to buildings, e.g. housing, house appliances or related end-user applications5%
Y02PClimate change mitigation technologies in the production or processing of goods4%
H01JElectric discharge tubes or discharge lamps3%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%
PatentTitleYear
11,118,223Methods, devices, and systems for analyte detection and analysis202111,107,554Methods and systems for sequence calling202111,038,072Shingled solar cell module202110,988,269Product handling and packaging system2021D0916651Solar panel2021D0913210Solar panel202110,900,078Methods, devices, and systems for analyte detection and analysis202110,861,999Shingled solar cell module comprising hidden tap interconnects202010,852,518Methods, devices, and systems for analyte detection and analysis202010,833,214Solar panel202010,830,703Methods, devices, and systems for analyte detection and analysis202010,804,422Multi-operation tool for photovoltaic cell processing2020D0896747Solar panel202010,730,698Systems and methods for handling and dispensing of items202010,703,521Product handling and packaging system2020D0875665Solar panel202010,543,942Product handling and packaging system202010,344,328Methods for biological sample processing and analysis201910,273,528Methods and systems for analyte detection and analysis201910,267,790Systems for biological sample processing and analysis201910,090,430System for manufacturing a shingled solar cell module201810,084,104Solar panel20189,947,820Shingled solar cell panel employing hidden taps20189,882,077'Shingled solar cell module'20189,876,132Shingled solar cell module20189,780,253'Shingled solar cell module'20179,484,484'Shingled solar cell module'2016D0767484'Solar panel'20169,401,451'Shingled solar cell module'20169,397,252'Shingled solar cell module'20169,356,184'Shingled solar cell module'20169,353,973'Concentrating photovoltaic-thermal solar energy collector'2016D0750556'Solar panel'20169,270,225'Concentrating solar energy collector'20169,153,413'Multi-beam scanning electron beam device and methods of using the same'20159,075,909'System and method to enable detection of viral infection by users of electronic communication devices'20158,686,279'Concentrating solar energy collector'20148,669,462'Concentrating solar energy collector'20147,969,564'System and method for defect localization on electrical test structures'20117,846,649'High resolution printer and a method for high resolution printing'20107,842,930'Charged particle detector assembly, charged particle beam apparatus and method for generating an image'20107,842,935'Raster frame beam system for electron beam lithography'20107,801,353'Method for defect detection using computer aided design data'20107,760,347'Design-based method for grouping systematic defects in lithography pattern writing system'20107,737,040'Method of reducing critical dimension bias during fabrication of a semiconductor device'20107,599,075'Automatic optical inspection using multiple objectives'20097,521,700'Raster frame beam system for electron beam lithography'20097,463,351'Process and assembly for non-destructive surface inspection'20087,410,737'System and method for process variation monitor'20087,379,161'Printer and a method for recording a multi-level image'20087,365,014'Reticle fabrication using a removable hard mask'20087,355,689'Automatic optical inspection using multiple objectives'20087,342,218'Methods and systems for optical inspection of surfaces based on laser screening'20087,098,468'Raster frame beam system for electron beam lithography'20067,054,480'System and method for process variation monitor'20067,053,985'Printer and a method for recording a multi-level image'20066,946,655'Spot grid array electron imaging system'20056,914,670'Defect detection with enhanced dynamic range'20056,897,941'Optical spot grid array printer'20056,862,491'System and method for process variation monitor'20056,861,660'Process and assembly for non-destructive surface inspection'20056,853,446'Variable angle illumination wafer inspection system'20056,841,787'Maskless photon-electron spot-grid array printer'20056,791,099'Laser scanning wafer inspection using nonlinear optical phenomena'20046,671,042'Multiple beam scanner for an inspection system'20036,671,398'Method and apparatus for inspection of patterned semiconductor wafers'20036,657,714'Defect detection with enhanced dynamic range'20036,639,201'Spot grid array imaging system'20036,587,193'Inspection systems performing two-dimensional imaging with line light spot'20036,469,784'Optical inspection method and apparatus utilizing a variable angle design'20026,366,352'Optical inspection method and apparatus utilizing a variable angle design'20026,317,514'Method and apparatus for inspection of patterned semiconductor wafers'20016,236,454'Multiple beam scanner for an inspection system'20016,208,751'Cluster tool'20016,124,924'Focus error correction method and apparatus'20006,122,046'Dual resolution combined laser spot scanning and area imaging inspection'20005,661,590'Quantum well infrared photo detector and monolithic chopper'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2010Patents assigned to APPLIED MATERIALS INC (25)· patent assignee history
2000–2008Based in Givatayim, IL· patent location history
2001–2010Based in Givataim, IL· patent location history
2005–2015Patents assigned to APPLIED MATERIALS ISRAEL LTD (12)· patent assignee history
2006–2015Based in Kiriat Ono, IL· patent location history
2014–2016Patents assigned to COGENRA SOLAR INC (8)· patent assignee history
2014–2021Based in Palo Alto, CA, US· patent location history
2016–2021Patents assigned to SUNPOWER CORP (21)· patent assignee history
2019–2021Patents assigned to ULTIMA GENOMICS INC (8)· patent assignee history
2020–2021Based in Menlo Park, CA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| APPLIED MATERIALS INC | 25 | 2000–2010 |
| SUNPOWER CORP | 21 | 2016–2021 |
| APPLIED MATERIALS ISRAEL LTD | 12 | 2005–2015 |
| COGENRA SOLAR INC | 8 | 2014–2016 |
| ULTIMA GENOMICS INC | 8 | 2019–2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Palo Alto, California, US | 33 | 2014–2021 |
| Kiriat Ono, IL | 13 | 2006–2015 |
| Givatayim, IL | 13 | 2000–2008 |
| Givataim, IL | 9 | 2001–2010 |
| Menlo Park, California, US | 4 | 2020–2021 |