Inventor
Clark Alexander Bendall
Inventor
Syracuse, NY, US
Overview
Patents· 48 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions21%
G06TImage data processing or generation, in general18%
H04NPictorial communication, e.g. television12%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
G06FElectric digital data processing9%
G02BOptical elements, systems or apparatus7%
A61BDiagnosis5%
G06KGraphical data reading5%
G06VImage or video recognition or understanding2%
B23BTurning1%
PatentTitleYear
11,125,551Light modulation for inspection probes202110,846,922Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object202010,699,149Method and device for automatically identifying a point of interest in a depth measurement on a viewed object202010,679,374Graphic overlay for measuring dimensions of features using a video inspection device202010,666,927Method and device for inspection of an asset202010,586,341Method and device for measuring features on or near an object202010,319,103Method and device for measuring features on or near an object201910,291,850Inspection apparatus method and apparatus comprising selective frame output201910,217,016Method and device for automatically identifying a point of interest in a depth measurement on a viewed object201910,157,495Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object201810,019,812Graphic overlay for measuring dimensions of features using a video inspection device201810,018,467System and method for measuring a distance to an object20189,984,474Method and device for measuring features on or near an object20189,875,574Method and device for automatically identifying the deepest point on the surface of an anomaly20189,842,430'Method and device for automatically identifying a point of interest on a viewed object'20179,818,039'Method and device for automatically identifying a point of interest in a depth measurement on a viewed object'20179,638,553'Modular inspection system handset'20179,633,426'Remote visual inspection image capture system and method'20179,621,808'Inspection apparatus method and apparatus comprising selective frame output'20179,600,928'Method and device for automatically identifying a point of interest on the surface of an anomaly'20179,525,852'Systems and methods for embedded imaging clocking'20169,412,189'Method and system for detecting known measurable object features'20169,354,670'Apparatus and method for pivot attachment'20169,074,868'Automated borescope measurement tip accuracy test'20159,013,469'Method and device for displaying a three-dimensional view of the surface of a viewed object'20158,976,363'System aspects for a probe system that utilizes structured-light'20158,810,636'Inspection apparatus method and apparatus comprising selective frame output'20148,786,300'Probe assembly and methods for use in inspecting a component'20148,760,447'Method of determining the profile of a surface of an object'20148,422,030'Fringe projection system with intensity modulating by columns of a plurality of grating elements'20138,411,083'Method and device for displaying an indication of the quality of the three-dimensional data for a surface of a viewed object'20138,368,749'Article inspection apparatus'20138,310,533'Inspection apparatus for inspecting articles'20128,213,676'Inspection apparatus method and apparatus comprising motion responsive control'20128,199,813'Method for embedding frames of high quality image data in a streaming video'20128,165,351'Method of structured light-based measurement'20128,107,083'System aspects for a probe system that utilizes structured-light'20127,969,583'System and method to determine an object distance from a reference point to a point on the object surface'20117,961,401'System for providing two position zoom-focus'20117,821,649'Fringe projection system and method for a probe suitable for phase-shift analysis'20107,812,968'Fringe projection system and method for a probe using a coherent fiber bundle'20107,782,453'Method for measuring missing corner dimensions'20107,564,626'Stereo-measurement borescope with 3-D viewing'20097,262,797'Method and system for storing calibration data within image files'20077,170,677'Stereo-measurement borescope with 3-D viewing'20076,830,545'Tube gripper integral with controller for endoscope of borescope'20046,407,603'Analog voltage isolation circuit'20025,602,463'DC power supply with enhanced input power factor using a buck and boost converter'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997Based in Endicott, NY, US· patent location history
2002–2020Based in Syracuse, NY, US· patent location history
2007–2014Patents assigned to GE INSPECTION TECHNOLOGIES LP (10)· patent assignee history
2011–2021Patents assigned to GEN ELECTRIC (31)· patent assignee history
2012–2018Patents assigned to BENDALL CLARK ALEXANDER (9)· patent assignee history
2012–2014Patents assigned to BENDALL CLARK A (5)· patent assignee history
2012–2013Patents assigned to LAMBDIN THOMAS ELDRED (3)· patent assignee history
2018–2021Based in Skaneateles, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 31 | 2011–2021 |
| GE INSPECTION TECHNOLOGIES LP | 10 | 2007–2014 |
| BENDALL CLARK ALEXANDERself | 9 | 2012–2018 |
| BENDALL CLARK Aself | 5 | 2012–2014 |
| LAMBDIN THOMAS ELDRED | 3 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Syracuse, New York, US | 41 | 2002–2020 |
| Skaneateles, New York, US | 6 | 2018–2021 |
| Endicott, New York, US | 1 | 1997 |