Inventor
Atsushi Kida
Inventor
Tokyo, JP
Overview
Patents· 27 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Mprimary
G01MTesting static or dynamic balance of machines or structures53%
G01CMeasuring distances, levels or bearings25%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
G01SRadio direction-finding6%
B60RVehicles, vehicle fittings, or vehicle parts, not otherwise provided for3%
G08GTraffic control systems3%
PatentTitleYear
11,100,800Collision determination apparatus and collision determination method20216,804,386'Optical member inspecting apparatus and method of inspection thereof'20046,788,804'Optical member inspecting apparatus and method of inspection thereof'20046,717,683'Target for photogrammetric analytical measurement system'20046,697,513'Optical member inspecting apparatus and method of inspection thereof'20046,636,625'Optical member inspecting apparatus and method of inspection thereof'20036,628,803'Device for calculating positional data of standard points of photogrammetric target'20036,600,511'Camera for use in photogrammetric analytical measurement'20036,535,627'Optical member inspecting apparatus and method of inspection thereof'20036,476,909'Optical member inspecting apparatus and method of inspection thereof'20026,477,264'Optical member inspecting apparatus and method of inspection thereof'20026,434,263'Optical member inspecting apparatus and method of inspection thereof'20026,430,310'Optical member inspecting apparatus and method of inspection thereof'20026,427,023'Optical member inspecting apparatus and method of inspection thereof'20026,363,165'Optical member inspecting apparatus and method of inspection thereof'20026,351,554'Optical member inspecting apparatus and method of inspection thereof'20026,349,145'Optical member inspecting apparatus and method of inspection thereof'20026,339,683'Standard measurement scale and markers for defining standard measurement scale'20026,314,200'Optical member inspecting apparatus and method of inspection thereof'20016,304,669'Photogrammetric analytical measurement system'20016,148,097'Optical member inspecting apparatus and method of inspection thereof'20006,144,761'Photogrammetric analytical measurement system'20006,108,497'Standard measurement scale and markers for defining standard measurement scale'20005,995,765'Camera with distance-measuring sensor unit for use in photogrammetric analytical measurement'19995,847,822'Optical element inspecting apparatus'19985,835,207'Optical member inspecting apparatus'19985,828,500'Optical element inspecting apparatus'1998Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1998–2004Patents assigned to ASAHI OPTICAL CO LTD (22)· patent assignee history
1998–2004Based in Tokyo, JP· patent location history
1999–2004Based in Saitama, JP· patent location history
2002Patents assigned to ASAHI KUGAKU KOGYO KABUSHIKI K (1)· patent assignee history
2003–2004Patents assigned to PENTAX CORP (3)· patent assignee history
2021Patents assigned to DENSO CORP (1)· patent assignee history
2021Patents assigned to TOYOTA MOTOR CO LTD (1)· patent assignee history
2021Based in Toyota, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASAHI OPTICAL CO LTD | 22 | 1998–2004 |
| PENTAX CORP | 3 | 2003–2004 |
| ASAHI KUGAKU KOGYO KABUSHIKI K | 1 | 2002 |
| DENSO CORP | 1 | 2021 |
| TOYOTA MOTOR CO LTD | 1 | 2021 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 20 | 1998–2004 |
| Saitama, JP | 6 | 1999–2004 |
| Toyota, JP | 1 | 2021 |