Inventor
Naoki Nakazawa
Inventor
Tokyo, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
A61Bprimary
A61BDiagnosis50%
G09BEducational or demonstration appliances13%
G11BInformation storage based on relative movement between record carrier and transducer13%
H05KPrinted circuits13%
Y10TTechnical subjects covered by former us classification13%
PatentTitleYear
7,648,240'Ophthalmic apparatus'20107,223,480'Metal laminate and etching method therefor'20077,036,933'Model eye for eye characteristic measuring device and calibration method for the same'20066,676,258'Eye characteristic measurement apparatus with speckle noise reduction'20046,525,883'Optical characteristic measuring instrument'2003Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2003–2010Patents assigned to TOPCON CORP (4)· patent assignee history
2003–2010Based in Tokyo, JP· patent location history
2007Patents assigned to MITSUI CHEMICALS INC (1)· patent assignee history
2007Based in Sodegaura, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| TOPCON CORP | 4 | 2003–2010 |
| MITSUI CHEMICALS INC | 1 | 2007 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 4 | 2003–2010 |
| Sodegaura, JP | 1 | 2007 |