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Inventor

Junichi Murai

Inventor
Tokyo, JP

Overview

5→
Patents
1997–2016
Patent span
Electricity
Primary field (CPC H)

Patents· 5 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties29%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h1029%
G11BInformation storage based on relative movement between record carrier and transducer14%
H01LSemiconductor devices14%
H05KPrinted circuits14%
PatentTitleYear
9,443,778'Semiconductor device and manufacturing method thereof'20168,590,381'Ultrasonic flaw detection method and ultrasonic flaw detection equipment'20138,584,526'Ultrasonic flaw detection method and ultrasonic flaw detection equipment'20137,361,983'Semiconductor device and semiconductor assembly module with a gap-controlling lead structure'20085,671,212'Disc cartridge'1997

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1997Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (1)· patent assignee history
1997Based in Kobe, JP· patent location history
2008–2016Patents assigned to MITSUBISHI ELECTRIC CORP (2)· patent assignee history
2008–2016Based in Tokyo, JP· patent location history
2013Patents assigned to BRACONNIER DOMINIQUE (2)· patent assignee history
2013Patents assigned to KRAUTKRAMER JAPAN CO LTD (2)· patent assignee history
2013Patents assigned to MURAI JUNICHI (2)· patent assignee history
2013Based in Higashiosaka, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
BRACONNIER DOMINIQUE22013
KRAUTKRAMER JAPAN CO LTD22013
MITSUBISHI ELECTRIC CORP22008–2016
MURAI JUNICHIself22013
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD11997
Locations
LocationPatentsSpan
Tokyo, JP22008–2016
Higashiosaka, JP22013
Kobe, JP11997