Inventor
Paul Jacques Van Wijnen
Inventor
Veldhoven, NL
Overview
Patents· 8 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G03Fprimary
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices30%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1015%
G01BMeasuring length, thickness or similar linear dimensions11%
G01NInvestigating or analysing materials by determining their chemical or physical properties11%
G05BControl or regulating systems in general11%
H01LSemiconductor devices11%
Y02PClimate change mitigation technologies in the production or processing of goods11%
PatentTitleYear
10,746,668Methods and apparatus for measuring a property of a substrate202010,317,191Methods and apparatus for measuring a property of a substrate20199,594,029'Methods and apparatus for measuring a property of a substrate'20178,642,235'Method of optimizing a die size, method of designing a pattern device manufacturing method, and computer program product'20147,679,714'Lithographic apparatus, combination of lithographic apparatus and processing module, and device manufacturing method'20107,679,715'Lithographic processing cell, lithographic apparatus, track and device manufacturing method'20107,403,259'Lithographic processing cell, lithographic apparatus, track and device manufacturing method'20087,112,813'Device inspection method and apparatus using an asymmetric marker'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2020Patents assigned to ASML NETHERLANDS BV (8)· patent assignee history
2006–2020Based in Veldhoven, NL· patent location history
2014Patents assigned to BORNEBROEK FRANK (1)· patent assignee history
2014Patents assigned to VAN WIJNEN PAUL JACQUES (1)· patent assignee history
2014Patents assigned to VESELINOVIC PETAR (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 8 | 2006–2020 |
| BORNEBROEK FRANK | 1 | 2014 |
| VAN WIJNEN PAUL JACQUESself | 1 | 2014 |
| VESELINOVIC PETAR | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Veldhoven, NL | 8 | 2006–2020 |