Inventor
Yoshio Fukuda
Inventor
Hino, JP
Overview
Patents· 18 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H04Nprimary
H04NPictorial communication, e.g. television22%
G11BInformation storage based on relative movement between record carrier and transducer14%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests8%
G01SRadio direction-finding6%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h106%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h106%
G01BMeasuring length, thickness or similar linear dimensions3%
G01DMeasuring not specially adapted for a specific variable3%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves3%
PatentTitleYear
10,971,466High frequency module and communication device20219,560,246'Displacement monitoring system having vibration cancellation capabilities'20179,319,538'Management apparatus, image processing apparatus and image processing system'20168,224,062'Method and apparatus for inspection of wafer and semiconductor device'20127,790,506'Method of manufacturing semiconductor devices encapsulated in chip size packages'20107,724,297'Imaging device having a display to display images captured by a plurality of image sensors with different display regions'20107,489,339'Print system, and printer and digital camera making up system'20095,631,457'Two-dimensional symbol data read apparatus'19975,003,423'Vertical recording magnetic head'19914,970,608'Editing system for rearranging allocation of information units on an information recording medium'19904,939,930'Electric capacitance strain gauge'19904,873,580'Detachable unit electronic camera'19894,811,118'Detachable unit electronic camera'19894,746,990'Detachable unit electronic camera'19884,353,255'Method for determining shape of crack'19824,284,887'Polychromatic X-ray source for diffraction apparatus using _polychromatic X-rays'19814,092,069'Spectrophotometer'19783,972,617'Spectrophotometer'1976Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1976–1978Patents assigned to SHIMADZU CORP (2)· patent assignee history
1976–2021Based in Kyoto, JP· patent location history
1981–1990Patents assigned to HITACHI LTD (3)· patent assignee history
1981–1990Based in Hitachi, JP· patent location history
1988–1997Patents assigned to OLYMPUS OPTICAL CO (6)· patent assignee history
1988–2009Based in Hino, JP· patent location history
2010–2012Patents assigned to YAMAHA CORP (2)· patent assignee history
2010–2012Based in Ebino-shi, JP· patent location history
2012–2016Patents assigned to FUKUDA YOSHIO (2)· patent assignee history
2017Based in Astoria, NY, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OLYMPUS OPTICAL CO | 6 | 1988–1997 |
| HITACHI LTD | 3 | 1981–1990 |
| FUKUDA YOSHIOself | 2 | 2012–2016 |
| SHIMADZU CORP | 2 | 1976–1978 |
| YAMAHA CORP | 2 | 2010–2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hino, JP | 6 | 1988–2009 |
| Kyoto, JP | 3 | 1976–2021 |
| Hitachi, JP | 3 | 1981–1990 |
| Ebino-shi, JP | 2 | 2010–2012 |
| Astoria, New York, US | 1 | 2017 |