Inventor
Tomohiko Koto
Inventor
Kasugai, JP
Overview
Patents· 10 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H03Kprimary
H03KPulse technique50%
G01RMeasuring electric variables14%
G11CStatic stores14%
G05FSystems for regulating electric or magnetic variables7%
G11BInformation storage based on relative movement between record carrier and transducer7%
H03FAmplifiers7%
PatentTitleYear
11,038,506Output circuit202110,983,544Output circuit20219,780,762'Level converter circuit'20177,898,292'Level converter'20117,710,145'Semiconductor device and method for controlling thereof'20107,630,845'Method for calculating tolerable value for fluctuation in power supply voltage and method of testing'20097,088,142'Semiconductor integrated circuit and level conversion circuit'20067,019,578'Input circuit'20066,598,187'Semiconductor integrated circuit device with test circuit'20036,310,826'Semiconductor device having a test circuit'2001Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2001–2006Patents assigned to FUJITSU LTD (4)· patent assignee history
2001–2017Based in Kasugai, JP· patent location history
2009–2010Patents assigned to FUJITSU MICROELECTRONICS LTD (2)· patent assignee history
2011Patents assigned to FUJITSU SEMICONDUCTOR LTD (1)· patent assignee history
2017–2021Patents assigned to SOCIONEXT INC (3)· patent assignee history
2021Based in Yokohama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FUJITSU LTD | 4 | 2001–2006 |
| SOCIONEXT INC | 3 | 2017–2021 |
| FUJITSU MICROELECTRONICS LTD | 2 | 2009–2010 |
| FUJITSU SEMICONDUCTOR LTD | 1 | 2011 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kasugai, JP | 8 | 2001–2017 |
| Yokohama, JP | 2 | 2021 |