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Inventor

Shinichiro Takase

Inventor
Nirasaki, JP

Overview

3→
Patents
2012–2013
Patent span
Physics
Primary field (CPC G)

Patents· 3 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables100%
PatentTitleYear
8,415,964'Probe card having a structure for being prevented from deforming'20138,319,511'Probe device having a structure for being prevented from deforming'20128,310,257'Contact structure for inspection'2012

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2012–2013Patents assigned to TAKASE SHINICHIRO (3)· patent assignee history
2012–2013Patents assigned to TOKYO ELECTRON LTD (3)· patent assignee history
2012–2013Patents assigned to YONEZAWA TOSHIHIRO (2)· patent assignee history
2012Patents assigned to FURUYA KUNIHIRO (1)· patent assignee history
2012Patents assigned to MOCHIZUKI JUN (1)· patent assignee history
2012–2013Based in Nirasaki, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TAKASE SHINICHIROself32012–2013
TOKYO ELECTRON LTD32012–2013
YONEZAWA TOSHIHIRO22012–2013
FURUYA KUNIHIRO12012
MOCHIZUKI JUN12012
Locations
LocationPatentsSpan
Nirasaki, JP32012–2013