Inventor
Hidetoshi Sugiyama
Inventor
Hitachinaka, JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties27%
G01RMeasuring electric variables18%
H10DInorganic electric semiconductor devices18%
B01LChemical or physical laboratory apparatus for general use9%
G11CStatic stores9%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h109%
Y10TTechnical subjects covered by former us classification9%
PatentTitleYear
8,765,474'Automatic analyzer and the analyzing method using the same'20148,754,632'Integrated circuit with power state determination circuit'20148,409,507'Automatic analyzer'20137,750,437'Semiconductor device having a diode for a rectifier circuit'20107,603,248'Testing circuit and testing method for semiconductor device and semiconductor chip'20097,360,984'Automatic analyzer and part feeding device used for the analyzer'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2014Based in Hitachinaka, JP· patent location history
2009–2010Based in Kawasaki, JP· patent location history
2010–2014Patents assigned to FUJITSU SEMICONDUCTOR LTD (2)· patent assignee history
2013–2014Patents assigned to SUGIYAMA HIDETOSHI (3)· patent assignee history
2013–2014Patents assigned to HITACHI HIGH TECH CORP (2)· patent assignee history
2013Patents assigned to AWATA YASUNAO (1)· patent assignee history
2013Patents assigned to DOPPEN WERNER (1)· patent assignee history
2014Based in Yokohama, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| SUGIYAMA HIDETOSHIself | 3 | 2013–2014 |
| FUJITSU SEMICONDUCTOR LTD | 2 | 2010–2014 |
| HITACHI HIGH TECH CORP | 2 | 2013–2014 |
| AWATA YASUNAO | 1 | 2013 |
| DOPPEN WERNER | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hitachinaka, JP | 3 | 2008–2014 |
| Kawasaki, JP | 2 | 2009–2010 |
| Yokohama, JP | 1 | 2014 |