Inventor

Marcin Walerysiak

Inventor

Skrzeszew, PL

Overview

2→

Patents

2013–2015

Patent span

Chemistry

Primary field (CPC C)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

C01Bprimary

C01BNon-metallic elements17%

C30BSingle-crystal growth17%

H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation17%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%

Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution17%

Y10TTechnical subjects covered by former us classification17%

PatentTitleYear

8,968,467'Method and system for controlling resistivity in ingots made of compensated feedstock silicon'2015 8,547,121'Quality control process for UMG-SI feedstock'2013

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2013–2015Patents assigned to HEUER MATTHIAS (2)· patent assignee history

2013–2015Patents assigned to JOUINI ANIS (2)· patent assignee history

2013–2015Patents assigned to KIRSCHT FRITZ (2)· patent assignee history

2013–2015Patents assigned to OUNADJELA KAMEL (2)· patent assignee history

2013–2015Patents assigned to SILICOR MATERIALS INC (2)· patent assignee history

2013–2015Based in Skrzeszew, PL· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
HEUER MATTHIAS	2	2013–2015
JOUINI ANIS	2	2013–2015
KIRSCHT FRITZ	2	2013–2015
OUNADJELA KAMEL	2	2013–2015
SILICOR MATERIALS INC	2	2013–2015

Locations

Location	Patents	Span
Skrzeszew, PL	2	2013–2015