Inventor
RYOHEI KANNO
Inventor
JP
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
LOC10primary
LOC1020%
H01LSemiconductor devices13%
H10DInorganic electric semiconductor devices13%
C23CCoating metallic material7%
G01BMeasuring length, thickness or similar linear dimensions7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
H02MApparatus for conversion between ac and ac, between ac and dc, or between dc and dc, and for use with mains or similar power supply systems7%
H04NPictorial communication, e.g. television7%
H10HInorganic light-emitting semiconductor devices having potential barriers7%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h107%
PatentTitleYear
12,578,182Image measurement system, image measurement method, and program202612,191,372Crystal, semiconductor element and semiconductor device202512,107,125Oxide semiconductor film and semiconductor device2024D1001657Image measuring device2023D0986075Image measuring device2023D0981879Image measuring device2023Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2023–2026Patents assigned to MITUTOYO CORP (4)· patent assignee history
2023–2026Based in JP· patent location history
2024–2025Patents assigned to FLOSFIA INC (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITUTOYO CORP | 4 | 2023–2026 |
| FLOSFIA INC | 2 | 2024–2025 |
Locations
| Location | Patents | Span |
|---|---|---|
| JP | 6 | 2023–2026 |