Inventor
Ui Won Suh
Inventor
Cincinnati, OH, US
Overview
Patents· 22 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties46%
C21DModifying the physical structure of ferrous metals15%
B23KSoldering or unsoldering12%
F01DNon-positive displacement machines or engines, e.g. steam turbines7%
G01BMeasuring length, thickness or similar linear dimensions5%
Y10TTechnical subjects covered by former us classification5%
G06VImage or video recognition or understanding2%
G10KSound-producing devices2%
G21CNuclear reactors2%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution2%
PatentTitleYear
8,269,489'System and method for eddy current inspection of parts with complex geometries'20128,013,599'Methods and apparatus for testing a component'20117,952,348'Flexible eddy current array probe and methods of assembling the same'20117,948,233'Omnidirectional eddy current array probes and methods of use'20117,888,932'Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same'20117,817,845'Multi-frequency image processing for inspecting parts having complex geometric shapes'20107,689,030'Methods and apparatus for testing a component'20107,657,389'Method of aligning probe for eddy current inspection'20107,518,359'Inspection of non-planar parts using multifrequency eddy current with phase analysis'20097,436,992'Methods and apparatus for testing a component'20087,337,651'Method for performing model based scanplan generation of a component under inspection'20087,206,706'Inspection method and system using multifrequency phase analysis'20077,154,265'Eddy current probe and inspection method'20066,914,215'Real time laser shock peening quality assurance by natural frequency analysis'20056,907,358'Eddy current inspection method'20056,629,464'Laser shock peening quality assurance by acoustic analysis'20036,570,126'Simultaneous offset dual sided laser shock peening using low energy laser beams'20036,570,125'Simultaneous offset dual sided laser shock peening with oblique angle laser beams'20036,422,082'Laser shock peening quality assurance by ultrasonic analysis'20026,296,448'Simultaneous offset dual sided laser shock peening'20016,237,419'Aspherical curved element transducer to inspect a part with curved entry surface'20016,075,593'Method for monitoring and controlling laser shock peening using temporal light spectrum analysis'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2012Patents assigned to GEN ELECTRIC (21)· patent assignee history
2000–2012Based in Cincinnati, OH, US· patent location history
2002Based in Cincinnatti, OH, US· patent location history
2012Patents assigned to MCKNIGHT WILLIAM STEWART (1)· patent assignee history
2012Patents assigned to PLOTNIKOV YURY ALEXEYEVICH (1)· patent assignee history
2012Patents assigned to SUH UI WON (1)· patent assignee history
2012Patents assigned to WANG CHANGTING (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| GEN ELECTRIC | 21 | 2000–2012 |
| MCKNIGHT WILLIAM STEWART | 1 | 2012 |
| PLOTNIKOV YURY ALEXEYEVICH | 1 | 2012 |
| SUH UI WONself | 1 | 2012 |
| WANG CHANGTING | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Cincinnati, OH, US | 21 | 2000–2012 |
| Cincinnatti, OH, US | 1 | 2002 |