Inventor
Shinichi Wakana
Inventor
Kawasaki, JP
Overview
Patents· 14 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus22%
G01RMeasuring electric variables19%
G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves7%
G01NInvestigating or analysing materials by determining their chemical or physical properties7%
G01QScanning-probe techniques or apparatus7%
H03HImpedance networks, e.g. resonant circuits7%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests7%
B82YSpecific uses or applications of nanostructures4%
G06FElectric digital data processing4%
G06QInformation and communication technology [ict] specially adapted for administrative, commercial, financial, managerial or supervisory purposes4%
PatentTitleYear
10,528,588Platform system, data conversion method and computer-readable non-transitory medium20208,410,805'Electric field detection probe, method thereof, and manufacturing method of circuit board'20137,570,848'Lens adjusting method, lens adjusting device, and optical switch'20097,362,033'Surface-acoustic-wave device'20087,319,821'Chromatic dispersion generating apparatus'20087,301,336'Magnetic field generator device for calibration of magnetic force microscope'20077,233,719'Dispersion slope compensator'20077,197,211'Variable wavelength dispersion compensator'20077,073,915'Mirror fixing method and optical apparatus'20067,054,005'Elastic-wave monitoring device and surface-acoustic-wave device'20066,832,020'Variable wavelength dispersion compensator'20046,573,699'Device for measuring electric current by use of electro-optical crystal'20035,550,479'Signal measuring apparatus and signal measuring method'19965,331,275'Probing device and system for testing an integrated circuit'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994–2020Patents assigned to FUJITSU LTD (14)· patent assignee history
1994–2013Based in Kawasaki, JP· patent location history
1996Patents assigned to ADVANTEST CORP (1)· patent assignee history
2013Patents assigned to UCHIDA DAISUKE (1)· patent assignee history
2013Patents assigned to WAKANA SHINICHI (1)· patent assignee history
2020Based in Musashino, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FUJITSU LTD | 14 | 1994–2020 |
| ADVANTEST CORP | 1 | 1996 |
| UCHIDA DAISUKE | 1 | 2013 |
| WAKANA SHINICHIself | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kawasaki, JP | 13 | 1994–2013 |
| Musashino, JP | 1 | 2020 |