Inventor
Kazuo Iketaki
Inventor
Kyoto, JP
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties44%
Y10TTechnical subjects covered by former us classification22%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms11%
G01KMeasuring temperature11%
G11BInformation storage based on relative movement between record carrier and transducer11%
PatentTitleYear
7,351,323'Quantitative analyzing method and quantitative analyzer using sensor'20087,122,111'Sample discriminating method'20066,824,670'Sample discriminating method'20046,576,117'Method and apparatus for electrochemical measurement using statistical technique'20033,959,818'Servo for video tape apparatus with editing capabilities'1976Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1976Patents assigned to SONY CORP (1)· patent assignee history
1976Based in Yokohama, JP· patent location history
2003Patents assigned to ARKRAY (1)· patent assignee history
2003–2008Based in Kyoto, JP· patent location history
2004–2008Patents assigned to ARKRAY INC (3)· patent assignee history
2004Patents assigned to MATSUSHITA ELECTRIC INDUSTRIAL CO LTD (1)· patent assignee history
2004–2006Based in Otsu, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ARKRAY INC | 3 | 2004–2008 |
| ARKRAY | 1 | 2003 |
| MATSUSHITA ELECTRIC INDUSTRIAL CO LTD | 1 | 2004 |
| SONY CORP | 1 | 1976 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kyoto, JP | 2 | 2003–2008 |
| Otsu, JP | 2 | 2004–2006 |
| Yokohama, JP | 1 | 1976 |