Inventor
Thomas Franciscus Waayers
Inventor
Eindhoven, NL
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables86%
G06FElectric digital data processing14%
PatentTitleYear
8,410,787'Testing of an integrated circuit with a plurality of clock domains'20137,620,866'Test access architecture and method of testing a module in an electronic circuit'20097,571,068'Module, electronic device and evaluation tool'20097,409,612'Testing of integrated circuits'20087,124,340'Low pin count, high-speed boundary scan testing'20066,988,230'Test arrangement for assemblages of intergrated circuit blocks'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006Patents assigned to KONINKL PHILIPS ELECTRONICS NV (2)· patent assignee history
2006–2009Based in Eindhoven, NL· patent location history
2008–2013Patents assigned to NXP BV (4)· patent assignee history
2009–2013Based in Sint Michielsgestel, NL· patent location history
2013Patents assigned to MORREN RICHARD (1)· patent assignee history
2013Patents assigned to WAAYERS THOMAS F (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| NXP BV | 4 | 2008–2013 |
| KONINKL PHILIPS ELECTRONICS NV | 2 | 2006 |
| MORREN RICHARD | 1 | 2013 |
| WAAYERS THOMAS Fself | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Eindhoven, NL | 4 | 2006–2009 |
| Sint Michielsgestel, NL | 2 | 2009–2013 |