Inventor
Frank Hecht
Inventor
Weimar, DE
Overview
Patents· 12 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus56%
G01NInvestigating or analysing materials by determining their chemical or physical properties19%
G01BMeasuring length, thickness or similar linear dimensions6%
G06FElectric digital data processing6%
G06TImage data processing or generation, in general6%
LOC326%
PatentTitleYear
11,086,119Fluorescence-lifetime imaging microscopy method having time-correlated single-photon counting202110,520,434Fluorescence lifetime imaging microscopy method having time-correlated single-photon counting, which method permits higher light intensities201910,261,306Method to be carried out when operating a microscope and microscope20198,908,271'Laser scanning microscope and its operating method'20148,780,443'Method and arrangement for controlled actuation of a microscope, in particular of a laser scanning microscope'20148,120,771'Configuration of a laser scanning microscope for raster image correlation spectroscopy measurement and method for conducting and evaluating such a measurement'2012D0608787'User interface for computer screen'20107,593,581'Process for the acquisition of images from a sample with a microscope'20097,456,026'Imaging fluorescence correlation spectroscopy for analysis of molecular interactions in low volumes'20087,323,679'Procedure for the optical acquisition of objects by means of a light raster microscope with line by line scanning'20087,235,777'Light scanning microscope and use'20076,819,415'Assembly for increasing the depth discrimination of an optical imaging system'2004Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2004–2008Patents assigned to ZEISS CARL JENA GMBH (3)· patent assignee history
2004–2014Based in Weimar, DE· patent location history
2008–2014Patents assigned to ZEISS CARL MICROIMAGING GMBH (5)· patent assignee history
2012–2014Patents assigned to HECHT FRANK (2)· patent assignee history
2012–2014Patents assigned to NETZ RALF (2)· patent assignee history
2019–2021Patents assigned to LEICA MICROSYSTEMS (3)· patent assignee history
2019–2021Based in Mannheim, DE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ZEISS CARL MICROIMAGING GMBH | 5 | 2008–2014 |
| LEICA MICROSYSTEMS | 3 | 2019–2021 |
| ZEISS CARL JENA GMBH | 3 | 2004–2008 |
| HECHT FRANKself | 2 | 2012–2014 |
| NETZ RALF | 2 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Weimar, DE | 9 | 2004–2014 |
| Mannheim, DE | 3 | 2019–2021 |