Inventor
Darrell E. Schlicker
Inventor
Watertown, MA, US
Overview
Patents· 45 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties54%
G01RMeasuring electric variables16%
G01BMeasuring length, thickness or similar linear dimensions11%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure8%
G01VGeophysics6%
B24BMachines, devices, or processes for grinding or polishing2%
G01MTesting static or dynamic balance of machines or structures2%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h102%
PatentTitleYear
10,001,457Performance curve generation for non-destructive testing sensors20189,279,784'Durability enhanced and redundant embedded sensors'20169,207,131'Method and apparatus for load and additional property measurement'20158,803,515'Durability enhanced and redundant embedded sensors'20148,415,947'Method for stress assessment that removes temperature effects and hysteresis on the material property measurements'20138,237,433'Magnetic field characterization of stresses and properties in materials'20128,222,897'Test circuit with sense elements having associated and unassociated primary windings'20128,050,883'Material property estimation using inverse interpolation'20117,994,781'Eddy current sensor with concentric segments'20117,876,094'Magnetic field characterization of stresses and properties in materials'20117,812,601'Material condition assessment with eddy current sensors'20107,696,748'Absolute property measurements using electromagnetic sensors'20107,589,526'Surface mounted sensor arrays having segmented primary windings'20097,533,575'Quasistatic magnetic and electric field stress/strain gages'20097,526,964'Applied and residual stress measurements using magnetic field sensors'20097,528,598'Fastener and fitting based sensing methods'20097,518,360'Hybrid wound/etched winding constructs for scanning and monitoring'20097,467,057'Material property estimation using non-orthogonal responsive databases'20087,451,639'Engine blade dovetail inspection'20087,451,657'Material condition monitoring with multiple sensing modes'20087,411,390'High resolution inductive sensor arrays for UXO'20087,385,392'Eddy current sensing arrays and system'20087,348,771'Method for verifying sensor condition'20087,289,913'Local feature characterization using quasistatic electromagnetic sensors'20077,280,940'Segmented field dielectric sensor array for material characterization'20077,230,421'Damage standard fabrication with attached sensor'20077,188,532'Self-monitoring metals, alloys and materials'20077,183,764'Method for inspecting a channel using a flexible sensor'20077,161,350'Method for material property monitoring with perforated, surface mounted sensors'20077,161,351'Hidden feature characterization using a database of sensor responses'20077,095,224'Process control and damage monitoring'2006RE039206'Absolute property measurement with air calibration'20067,049,811'Test circuit having parallel drive segments and a plurality of sense elements'20066,995,557'High resolution inductive sensor arrays for material and defect characterization of welds'20066,992,482'Magnetic field sensor having a switchable drive current spatial distribution'20066,952,095'Surface mounted and scanning spatially periodic eddy-current sensor arrays'20056,798,198'Fluid supports for sensors'20046,784,662'Eddy current sensor arrays having drive windings with extended portions'20046,781,387'Inspection method using penetrant and dielectrometer'20046,727,691'High resolution inductive sensor arrays for material and defect characterization of welds'20046,657,429'Material condition assessment with spatially periodic field sensors'20036,486,673'Segmented field dielectrometer'20026,380,747'Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation grids'20026,188,218'Absolute property measurement with air calibration'20016,144,206'Magnetometer with waveform shaping'2000Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2000–2018Patents assigned to JENTEK SENSORS INC (45)· patent assignee history
2000–2012Based in Watertown, MA, US· patent location history
2012–2018Patents assigned to GOLDFINE NEIL J (5)· patent assignee history
2012–2018Patents assigned to GRUNDY DAVID C (5)· patent assignee history
2012–2018Patents assigned to SCHLICKER DARRELL E (5)· patent assignee history
2012–2014Patents assigned to WASHABAUGH ANDREW P (4)· patent assignee history
2012–2018Based in Freeland, MI, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| JENTEK SENSORS INC | 45 | 2000–2018 |
| GOLDFINE NEIL J | 5 | 2012–2018 |
| GRUNDY DAVID C | 5 | 2012–2018 |
| SCHLICKER DARRELL Eself | 5 | 2012–2018 |
| WASHABAUGH ANDREW P | 4 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Watertown, Massachusetts, US | 39 | 2000–2012 |
| Freeland, MI, US | 6 | 2012–2018 |