Inventor
Eric W. Strid
Inventor
Portland, OR, US
Overview
Patents· 39 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables61%
B82YSpecific uses or applications of nanostructures16%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h105%
Y10TTechnical subjects covered by former us classification5%
H01LSemiconductor devices3%
H01PWaveguides3%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light2%
PatentTitleYear
9,874,585Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same20189,372,214'High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same'20169,099,449'Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same'20158,970,240'Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same'20158,823,406'Systems and methods for simultaneous optical testing of a plurality of devices under test'20147,764,072'Differential signal probing system'20107,759,953'Active wafer probe'20107,723,999'Calibration structures for differential signal probing'20107,609,077'Differential signal probe with integral balun'20097,518,387'Shielded probe for testing a device under test'20097,489,149'Shielded probe for testing a device under test'20097,482,823'Shielded probe for testing a device under test'20097,443,186'On-wafer test structures for differential signals'20087,436,194'Shielded probe with low contact resistance for testing a device under test'20087,427,868'Active wafer probe'20087,321,233'System for evaluating probing networks'20087,304,488'Shielded probe for high-frequency testing of a device under test'20077,164,279'System for evaluating probing networks'20077,161,363'Probe for testing a device under test'20076,987,398'System for evaluating probing networks'20066,815,963'Probe for testing a device under test'20046,803,779'Interconnect assembly for use in evaluating probing networks'20046,608,496'Reference transmission line junction for probing device'20036,130,544'System for evaluating probing networks'20005,973,505'System for evaluating probing networks'19995,869,975'System for evaluating probing networks that have multiple probing ends'19995,659,255'Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels'19975,565,788'Coaxial wafer probe with tip shielding'19965,561,377'System for evaluating probing networks'19965,068,615'Noise parameter test apparatus'19915,047,725'Verification and correction method for an error model for a measurement network'19914,998,071'Noise parameter test method and apparatus'19914,891,612'Overlap interfaces between coplanar transmission lines which are tolerant to transverse and longitudinal misalignment'19904,858,160'System for setting reference reactance for vector corrected measurements'19894,853,627'Wafer probes'19894,849,689'Microwave wafer probe having replaceable probe tip'19894,827,211'Wafer probe'19894,764,723'Wafer probe'19884,697,143'Wafer probe'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987–2018Patents assigned to CASCADE MICROTECH INC (37)· patent assignee history
1987–2018Based in Portland, OR, US· patent location history
2014–2016Patents assigned to STRID ERIC W (2)· patent assignee history
2014Patents assigned to BOLT BRYAN (1)· patent assignee history
2015–2016Patents assigned to GLEASON K REED (2)· patent assignee history
2015–2016Patents assigned to SMITH KENNETH R (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CASCADE MICROTECH INC | 37 | 1987–2018 |
| GLEASON K REED | 2 | 2015–2016 |
| SMITH KENNETH R | 2 | 2015–2016 |
| STRID ERIC Wself | 2 | 2014–2016 |
| BOLT BRYAN | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Portland, OR, US | 39 | 1987–2018 |