Inventor

Leslie L. Deck

Inventor

Middletown, CT, US

Overview

1989–2021

Patent span

Physics

Primary field (CPC G)

Patents· 58 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary

G01BMeasuring length, thickness or similar linear dimensions52%

G01NInvestigating or analysing materials by determining their chemical or physical properties7%

G01DMeasuring not specially adapted for a specific variable5%

Y10TTechnical subjects covered by former us classification5%

G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light4%

G02BOptical elements, systems or apparatus4%

G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices3%

H01SDevices using the process of light amplification by stimulated emission of radiation [laser] to amplify or generate light3%

H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h103%

G01HMeasurement of mechanical vibrations or ultrasonic, sonic or infrasonic waves2%

PatentTitleYear

10,962,348Method and apparatus for optimizing the optical performance of interferometers2021 10,890,428Interferometric method and apparatus using calibration information relating a focus setting to a test object position2021 10,845,251Wavemeter using pairs of interferometric optical cavities2020 10,591,284Metrology of multi-layer stacks2020 10,451,413Surface topography apparatus and method2019 10,267,617Method and apparatus for optimizing the optical performance of interferometers2019 10,190,871Precision positioning system using a wavelength tunable laser2019 9,891,078'Interferometric encoders using spectral analysis'2018 9,115,975'Position monitoring system with reduced noise'2015 8,988,690'Interferometric encoder systems'2015 8,902,431'Low coherence interferometry with scan error correction'2014 8,670,127'Interferometric encoder systems'2014 8,379,218'Fiber-based interferometer system for monitoring an imaging interferometer'2013 8,300,233'Interferometric encoder systems'2012 8,120,781'Interferometric systems and methods featuring spectral analysis of unevenly sampled data'2012 8,045,175'Equal-path interferometer'2011 8,004,688'Scan error correction in low coherence scanning interferometry'2011 7,978,338'Compound reference interferometer'2011 7,948,639'Phase-shifting interferometry in the presence of vibration'2011 7,826,064'Interferometer system for monitoring an object'2010 7,796,273'Phase-shifting interferometry in the presence of vibration'2010 7,796,275'Phase-shifting interferometry in the presence of vibration using phase bias'2010 7,710,580'Vibration resistant interferometry'2010 7,639,367'Interferometer system for monitoring an object'2009 7,636,166'Interferometer system for monitoring an object'2009 7,564,568'Phase shifting interferometry with multiple accumulation'2009 7,327,469'Method for compensating errors in interferometric surface metrology'2008 7,321,430'Vibration resistant interferometry'2008 7,277,183'Vibration resistant interferometry'2007 7,042,578'Method and apparatus for absolute figure metrology'2006 7,030,995'Apparatus and method for mechanical phase shifting interferometry'2006 6,995,848'Method and apparatus for calibrating a wavelength-tuning interferometer'2006 6,924,898'Phase-shifting interferometry method and system'2005 6,910,813'Alignment of a lens array and a fiber array'2005 6,894,788'Interferometric system for automated radius of curvature measurements'2005 6,882,432'Frequency transform phase shifting interferometry'2005 6,806,965'Wavefront and intensity analyzer for collimated beams'2004 6,788,422'Method and apparatus for using quasi-stable light sources in interferometry applications'2004 6,744,522'Interferometer for measuring the thickness profile of thin transparent substrates'2004 6,717,680'Apparatus and method for phase-shifting interferometry'2004 6,643,024'Apparatus and method(s) for reducing the effects of coherent artifacts in an interferometer'2003 6,597,460'Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum'2003 6,434,176'Frequency stabilized laser system'2002 6,195,168'Infrared scanning interferometry apparatus and method'2001 6,028,670'Interferometric methods and systems using low coherence illumination'2000 5,999,263'Method and apparatus for performing interferometric measurements with reduced sensitivity to vibration'1999 5,953,124'Interferometric methods and systems using low coherence illumination'1999 5,784,164'Method and apparatus for automatically and simultaneously determining best focus and orientation of objects to be measured by broad-band interferometric means'1998 5,777,741'Method and apparatus for optical interferometric measurements with reduced sensitivity to vibration'1998 5,724,134'Calibration standard for optical gap measuring tools'1998 5,600,441'Interferometer and method for measuring the distance of an object surface with respect to the surface of a rotating disk'1997 5,589,938'Method and apparatus for optical interferometric measurements with reduced sensitivity to vibration'1996 5,568,003'Method and apparatus for producing repeatable motion from biased piezoelectric transducers'1996 5,402,234'Method and apparatus for the rapid acquisition of data in coherence scanning interferometry'1995 5,309,277'High intensity illuminator'1994 5,208,451'Method and apparatus for automated focusing of an interferometric optical system'1993 4,870,290'Object motion sensing and measuring apparatus using position sensing detectors'1989 4,864,515'Electronic sensing screen for measuring projectile parameters'1989

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1989Patents assigned to HONEYWELL INC (2)· patent assignee history

1989Based in Hennepin, MN, US· patent location history

1989Based in Eden Prairie, MN, US· patent location history

1993–2021Patents assigned to ZYGO CORP (56)· patent assignee history

1993–2021Based in Middletown, CT, US· patent location history

1998Based in Middeltown, CT, US· patent location history

2011Based in Middlefield, CT, US· patent location history

2012–2014Patents assigned to DECK LESLIE L (4)· patent assignee history

2012–2014Patents assigned to DE GROOT PETER J (3)· patent assignee history

2012–2013Patents assigned to DAVIDSON MARK (2)· patent assignee history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
ZYGO CORP	56	1993–2021
DECK LESLIE Lself	4	2012–2014
DE GROOT PETER J	3	2012–2014
DAVIDSON MARK	2	2012–2013
HONEYWELL INC	2	1989

Locations

Location	Patents	Span
Middletown, CT, US	54	1993–2021
Middlefield, CT, US	1	2011
Middeltown, CT, US	1	1998
Hennepin, Minnesota, US	1	1989
Eden Prairie, Minnesota, US	1	1989