Inventor
Bjorn BRAUER
Inventor
US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Tprimary
G06TImage data processing or generation, in general35%
G01NInvestigating or analysing materials by determining their chemical or physical properties16%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1010%
G06NComputing arrangements based on specific computational models8%
G06VImage or video recognition or understanding8%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices6%
H01LSemiconductor devices6%
G06FElectric digital data processing4%
G06KGraphical data reading2%
H01JElectric discharge tubes or discharge lamps2%
PatentTitleYear
12,229,935Semantic image segmentation for semiconductor-based applications202512,056,867Image contrast metrics for deriving and improving imaging conditions202411,983,865Deep generative model-based alignment for semiconductor applications202411,961,219Generative adversarial networks (GANs) for simulating specimen images202411,748,872Setting up inspection of a specimen202311,694,327Cross layer common-unique analysis for nuisance filtering202311,619,592Selecting defect detection methods for inspection of a specimen202311,615,993Clustering sub-care areas based on noise characteristics202311,580,650Multi-imaging mode image alignment202311,431,976System and method for inspection using tensor decomposition and singular value decomposition202211,416,982Controlling a process for inspection of a specimen202211,415,531Statistical learning-based mode selection for multi-mode inspection202211,328,435Image alignment setup for specimens with intra- and inter-specimen variations using unsupervised learning and adaptive database generation methods202211,328,411Print check repeater defect detection202211,328,410Deep generative models for optical or other mode selection202211,204,332Repeater defect detection202111,151,711Cross layer common-unique analysis for nuisance filtering2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2023Patents assigned to KLA TENCOR CORP (3)· patent assignee history
2021–2025Based in US· patent location history
2022–2025Patents assigned to KLA CORP (14)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| KLA CORP | 14 | 2022–2025 |
| KLA TENCOR CORP | 3 | 2021–2023 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 17 | 2021–2025 |