Inventor
Choon Leong Lou
Inventor
Hsinchu, TW
Overview
Patents· 26 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables62%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1011%
G01NInvestigating or analysing materials by determining their chemical or physical properties5%
H01LSemiconductor devices5%
F27BFurnaces, kilns, ovens or retorts in general3%
G01BMeasuring length, thickness or similar linear dimensions3%
G05DSystems for controlling or regulating non-electric variables3%
H03KPulse technique3%
H05KPrinted circuits3%
H10WGeneric packages, interconnections, connectors or other constructional details of devices covered by class h103%
PatentTitleYear
11,054,465Method of operating a probing apparatus202111,047,880Probing device202110,890,614Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test202110,184,957Testing apparatus, holding assembly, and probe card carrier201910,088,502Test assembly and method of manufacturing the same20189,885,746'Switching matrix and testing system for semiconductor characteristic measurement using the same'20189,739,830'Test assembly'20179,535,114'Testing device'20179,329,205'High-precision semiconductor device probing apparatus and system thereof'20168,692,570'Probe card for testing high-frequency signals'20148,389,926'Testing apparatus for light-emitting devices with a design for a removable sensing module'20138,310,264'Method for configuring combinational switching matrix and testing system for semiconductor devices using the same'20128,279,451'Probing apparatus with on-probe device-mapping function'20128,198,725'Heat sink and integrated circuit assembly using the same'20128,188,758'Enclosed probe station'20128,169,227'Probing apparatus with multiaxial stages for testing semiconductor devices'20128,035,405'Semiconductor devices testing apparatus with temperature-adjusting design'20117,928,749'Vertical probe comprising slots and probe card for integrated circuit devices using the same'20117,791,363'Low temperature probing apparatus'20107,675,307'Heating apparatus for semiconductor devices'20107,616,018'Integrated circuit probing apparatus having a temperature-adjusting mechanism'20097,576,553'Integrated circuit probing apparatus having a temperature-adjusting mechanism'20097,436,171'Apparatus for probing multiple integrated circuit devices'20087,295,023'Probe card'20077,253,646'Probe card with tunable stage and at least one replaceable probe'20076,906,543'Probe card for electrical testing a chip in a wide temperature range'2005Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2005–2016Patents assigned to STAR TECHN INC (18)· patent assignee history
2005–2017Based in Singapore, SG· patent location history
2008–2021Based in Hsinchu, TW· patent location history
2009Based in Hsinchu County, TW· patent location history
2010Based in Jhudong Township, TW· patent location history
2012–2018Patents assigned to LOU CHOON LEONG (9)· patent assignee history
2013–2016Patents assigned to CHEN HO YEH (2)· patent assignee history
2013–2018Patents assigned to WANG LI MIN (2)· patent assignee history
2017–2021Patents assigned to STAR TECH INC (8)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| STAR TECHN INC | 18 | 2005–2016 |
| LOU CHOON LEONGself | 9 | 2012–2018 |
| STAR TECH INC | 8 | 2017–2021 |
| CHEN HO YEH | 2 | 2013–2016 |
| WANG LI MIN | 2 | 2013–2018 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hsinchu, TW | 19 | 2008–2021 |
| Singapore, SG | 5 | 2005–2017 |
| Jhudong Township, TW | 1 | 2010 |
| Hsinchu County, TW | 1 | 2009 |