Inventor
Berend Helmerus Lich
Inventor
Weert, NL
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps55%
G01NInvestigating or analysing materials by determining their chemical or physical properties36%
G02BOptical elements, systems or apparatus9%
PatentTitleYear
9,711,325'Charged-particle microscope providing depth-resolved imagery'20179,478,393'Computational scanning microscopy with improved resolution'20168,704,176'Charged particle microscope providing depth-resolved imagery'20148,586,921'Charged-particle microscope providing depth-resolved imagery'20138,581,189'Charged particle microscopy imaging method'20138,232,523'SEM imaging method'2012Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2012–2017Patents assigned to FEI CO (6)· patent assignee history
2012–2013Patents assigned to BOUGHORBEL FAYSAL (3)· patent assignee history
2012–2013Patents assigned to KOOIJMAN CORNELIS SANDER (3)· patent assignee history
2012–2013Patents assigned to LICH BEREND HELMERUS (3)· patent assignee history
2012–2013Patents assigned to BOSCH ERIC GERARDUS THEODOOR (2)· patent assignee history
2012–2017Based in Weert, NL· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| FEI CO | 6 | 2012–2017 |
| BOUGHORBEL FAYSAL | 3 | 2012–2013 |
| KOOIJMAN CORNELIS SANDER | 3 | 2012–2013 |
| LICH BEREND HELMERUSself | 3 | 2012–2013 |
| BOSCH ERIC GERARDUS THEODOOR | 2 | 2012–2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Weert, NL | 6 | 2012–2017 |