Inventor
Takashi Yoneyama
Inventor
Sagamihara, JP
Overview
Patents· 37 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G02Bprimary
G02BOptical elements, systems or apparatus33%
Y10TTechnical subjects covered by former us classification13%
G11BInformation storage based on relative movement between record carrier and transducer12%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests12%
G03CPhotosensitive materials for photographic purposes4%
G01NInvestigating or analysing materials by determining their chemical or physical properties3%
G06TImage data processing or generation, in general3%
H04NPictorial communication, e.g. television3%
B24BMachines, devices, or processes for grinding or polishing1%
B24DTools for grinding, buffing or sharpening1%
PatentTitleYear
8,890,947'Microscope apparatus and method for image acquisition of specimen slides having scattered specimens'20148,837,676'Virtual-slide creating device'20148,730,315'Microscope apparatus and microscope observation method'20148,723,942'Photomicroscopy system, image input device, and automatic exposure method'20148,284,246'Microscope system, control method used for microscope system, and recording medium for reproducing a microscope state based on microscope operation history and a microscope operation item'20128,264,768'Microscope system'20128,014,579'Microscope system and method for synthesizing microscopic images'20117,949,161'Microscope system and method for synthesizing microscopic images'20117,929,738'Microscope apparatus and microscope system'20117,756,357'Microscope system for obtaining high and low magnification images'20107,706,597'Defect inspection apparatus and defect inspection method'20107,612,316'Focus detection device and fluorescent observation device using the same'2009D0595327'Microscope'20097,345,814'Microscope system and microscope focus maintaining device for the same'20087,333,265'Microscope apparatus'20087,304,282'Focus detection device and fluorescent observation device using the same'20077,086,529'Packaging material for photographic light-sensitive material and photographic light-sensitive material package using same'20066,980,359'Microscope system'20056,891,669'Microscope system'20056,649,893'Focus detecting device for an optical apparatus'20036,259,080'Autofocus device for microscope'20016,219,181'Monitor-aided microscope'20016,190,744'Paper container for photo-sensitive materials and package of photo-sensitive materials'20016,128,129'Automatic focusing apparatus for microscope'20006,052,223'Microscope with chromatic aberration correcting function'20006,043,475'Focal point adjustment apparatus and method applied to microscopes'20005,933,513'Image processing system for expanding focal depth of optical machine'19995,866,671'Molded parts used for photographic sensitive materials and resin compositions used to make thereof'19995,053,289'Magnetic recording medium'19914,922,675'Abrasive tape'19904,880,693'Magnetic recording medium'19894,825,181'Switching device'19894,696,859'Magnetic recording medium'19874,693,929'Magnetic recording medium'19874,587,170'Magnetic recording medium'19864,539,257'Magnetic recording medium having improved running properties'19854,497,864'Magnetic recording medium'1985Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1985–2006Patents assigned to FUJI PHOTO FILM CO LTD (10)· patent assignee history
1985–2014Based in Kanagawa, JP· patent location history
1989Based in Kawasaki, JP· patent location history
1999–2005Patents assigned to OLYMPUS OPTICAL CO (8)· patent assignee history
1999–2001Based in Hachioji, JP· patent location history
2000–2014Based in Sagamihara, JP· patent location history
2005–2014Patents assigned to OLYMPUS CORP (17)· patent assignee history
2008–2014Based in Tokyo, JP· patent location history
2012–2014Patents assigned to YONEYAMA TAKASHI (6)· patent assignee history
2012–2014Patents assigned to ISHII YASUKO (3)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| OLYMPUS CORP | 17 | 2005–2014 |
| FUJI PHOTO FILM CO LTD | 10 | 1985–2006 |
| OLYMPUS OPTICAL CO | 8 | 1999–2005 |
| YONEYAMA TAKASHIself | 6 | 2012–2014 |
| ISHII YASUKO | 3 | 2012–2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Sagamihara, JP | 17 | 2000–2014 |
| Kanagawa, JP | 12 | 1985–2014 |
| Hachioji, JP | 4 | 1999–2001 |
| Tokyo, JP | 3 | 2008–2014 |
| Kawasaki, JP | 1 | 1989 |