Inventor
Young-Woong Yoo
Inventor
Seoul, KR
Overview
Patents· 1 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions50%
G01NInvestigating or analysing materials by determining their chemical or physical properties50%
PatentTitleYear
8,487,999'Apparatus for measurement of surface profile'2013Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2013Patents assigned to CHO CHEOL-HOON (1)· patent assignee history
2013Patents assigned to CHOI YOUNG-JIN (1)· patent assignee history
2013Patents assigned to PEMTRON CO LTD (1)· patent assignee history
2013Patents assigned to YOO YOUNG-WOONG (1)· patent assignee history
2013Based in Seoul, KR· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| CHO CHEOL-HOON | 1 | 2013 |
| CHOI YOUNG-JIN | 1 | 2013 |
| PEMTRON CO LTD | 1 | 2013 |
| YOO YOUNG-WOONGself | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Seoul, KR | 1 | 2013 |