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Inventor

Masakazu Ichikawa

Inventor
Tokyo, JP

Overview

16→
Patents
1992–2007
Patent span
Physics
Primary field (CPC G)

Patents· 16 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

H01Jprimary
H01JElectric discharge tubes or discharge lamps18%
B82YSpecific uses or applications of nanostructures15%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests15%
G01QScanning-probe techniques or apparatus13%
G04CElectromechanical clocks or watches8%
B82BNanostructures formed by manipulation of individual atoms, molecules, or limited collections of atoms or molecules as discrete units5%
G04GElectronic time-pieces5%
G11BInformation storage based on relative movement between record carrier and transducer5%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h105%
G01RMeasuring electric variables3%
PatentTitleYear
7,161,874'Power generating type electronic timepiece'20076,876,602'Electronic timepiece, information processing device, method of displaying charged condition of secondary cell, and computer product'20056,747,748'Manufacturing method for a field-effect transistor, manufacturing method for a semiconductor device, and apparatus therefor'20045,973,469'Motor driving apparatus'19995,940,348'Electronic timepiece'19995,746,826'Method and apparatus for forming microstructure body'19985,689,494'Surface atom fabrication method and apparatus'19975,572,122'Apparatus including a specimen tilt mechanism for measuring electromagnetic field distribution in the specimen using a focused electron beam'19965,563,465'Actuator'19965,521,390'Nanodisplacement producing apparatus'19965,416,331'Surface atom fabrication method and apparatus'19955,345,080'Method of observing electron microscopic images and an apparatus for carrying out of the same'19945,298,747'Scanning interference electron microscopy'19945,229,607'Combination apparatus having a scanning electron microscope therein'19935,153,434'Electron microscope and method for observing microscopic image'19925,144,128'Surface microscope and surface microscopy'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–1998Patents assigned to HITACHI LTD (11)· patent assignee history
1992–2004Based in Tokyo, JP· patent location history
1996Based in Setagaya, JP· patent location history
1999–2007Patents assigned to CITIZEN WATCH CO LTD (4)· patent assignee history
1999Based in Soka, JP· patent location history
1999Based in Tanashi, JP· patent location history
2004Patents assigned to TOKYO ELECTRON LTD (1)· patent assignee history
2005–2007Based in Souka, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
HITACHI LTD111992–1998
CITIZEN WATCH CO LTD41999–2007
TOKYO ELECTRON LTD12004
Locations
LocationPatentsSpan
Tokyo, JP111992–2004
Souka, JP22005–2007
Soka, JP11999
Tanashi, JP11999
Setagaya, JP11996