Inventor
Ami Altman
Inventor
Tel Aviv, IL
Overview
Patents· 6 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Tprimary
G01TMeasurement of nuclear or x-radiation63%
A61BDiagnosis13%
G06FElectric digital data processing13%
Y10TTechnical subjects covered by former us classification13%
PatentTitleYear
10,885,202Method and apparatus to provide secure application execution20219,322,939'Imaging measurement system with a printed photodetector array'20168,513,612'Imaging measurement system with a printed organic photodiode array'20138,391,439'Detector array for spectral CT'20137,968,853'Double decker detector for spectral CT'20117,573,035'GOS ceramic scintillating fiber optics x-ray imaging plate for use in medical DF and RF imaging and in CT'2009Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2009–2013Patents assigned to KONINKL PHILIPS ELECTRONICS NV (3)· patent assignee history
2009–2011Based in Haifa, IL· patent location history
2013–2016Patents assigned to ALTMAN AMI (3)· patent assignee history
2013–2016Patents assigned to LEVENE SIMHA (3)· patent assignee history
2013–2016Patents assigned to WAINER NAOR (3)· patent assignee history
2013–2016Patents assigned to KONINKL PHILIPS NV (2)· patent assignee history
2013–2016Based in Tel Aviv, IL· patent location history
2021Based in Bedford, MA, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ALTMAN AMIself | 3 | 2013–2016 |
| KONINKL PHILIPS ELECTRONICS NV | 3 | 2009–2013 |
| LEVENE SIMHA | 3 | 2013–2016 |
| WAINER NAOR | 3 | 2013–2016 |
| KONINKL PHILIPS NV | 2 | 2013–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tel Aviv, IL | 3 | 2013–2016 |
| Haifa, IL | 2 | 2009–2011 |
| Bedford, Massachusetts, US | 1 | 2021 |