Inventor
Chester L. Mallory
Inventor
Campbell, CA, US
Overview
Patents· 17 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Rprimary
G01RMeasuring electric variables17%
G01NInvestigating or analysing materials by determining their chemical or physical properties13%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1013%
G01BMeasuring length, thickness or similar linear dimensions8%
G02BOptical elements, systems or apparatus8%
G05BControl or regulating systems in general8%
G06FElectric digital data processing8%
G07FCoin-freed or like apparatus8%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices4%
LOC184%
PatentTitleYear
8,876,612'Replaceable cosmetic panels for machine cabinets'20147,900,922'Replaceable cosmetic panels for machine cabinets'2011D0434202'Coin redemption apparatus'2000D0432159'Coin counting and sorting apparatus'20005,747,813'Broadband microspectro-reflectometer'19985,552,704'Eddy current test method and apparatus for measuring conductance by determining intersection of lift-off and selected curves'19965,260,668'Semiconductor surface resistivity probe with semiconductor temperature control'19935,067,805'Confocal scanning optical microscope'19914,951,190'Multilevel menu and hierarchy for selecting items and performing tasks thereon in a computer system'19904,945,220'Autofocusing system for microscope having contrast detection means'19904,907,931'Apparatus for handling semiconductor wafers'19904,843,538'Multi-level dynamic menu which suppresses display of items previously designated as non-selectable'19894,805,089'Process control interface system for managing measurement data'19894,776,695'High accuracy film thickness measurement system'19884,755,746'Apparatus and methods for semiconductor wafer testing'19884,703,252'Apparatus and methods for resistivity testing'19874,679,137'Process control interface system for designer and operator'1987Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1987–2000Patents assigned to PROMETRIX CORP (12)· patent assignee history
1987–1998Based in Campbell, CA, US· patent location history
1988–1990Based in Santa Clara, CA, US· patent location history
1996Patents assigned to TENCOR INSTRUMENTS (1)· patent assignee history
1998Patents assigned to KLA TENCOP CORP (1)· patent assignee history
2000–2014Based in Reno, NV, US· patent location history
2011–2014Patents assigned to STRAGENT LLC (2)· patent assignee history
2014Patents assigned to MALLORY CHESTER L (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| PROMETRIX CORP | 12 | 1987–2000 |
| STRAGENT LLC | 2 | 2011–2014 |
| KLA TENCOP CORP | 1 | 1998 |
| MALLORY CHESTER Lself | 1 | 2014 |
| TENCOR INSTRUMENTS | 1 | 1996 |
Locations
| Location | Patents | Span |
|---|---|---|
| Campbell, California, US | 11 | 1987–1998 |
| Reno, NV, US | 4 | 2000–2014 |
| Santa Clara, California, US | 2 | 1988–1990 |