Inventor

Akitoshi Toda

Inventor

Kunitachi, JP

Overview

1985–2021

Patent span

Physics

Primary field (CPC G)

Patents· 47 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Qprimary

G01QScanning-probe techniques or apparatus19%

B82YSpecific uses or applications of nanostructures17%

Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests17%

G03GElectrography7%

G02BOptical elements, systems or apparatus6%

G02FOptical devices or arrangements for the control of light by modification of the optical properties of the media of the elements involved therein5%

G01BMeasuring length, thickness or similar linear dimensions4%

G11BInformation storage based on relative movement between record carrier and transducer3%

A61BDiagnosis2%

H01JElectric discharge tubes or discharge lamps2%

PatentTitleYear

11,008,002Vehicle control device, vehicle control method, and program for collision avoidance2021 11,002,355Actuator with sensor on output flange2021 10,955,039Transmission and actuator2021 10,907,668Flow damper, pressure-accumulation and water-injection apparatus, and nuclear installation2021 10,900,508Flow damper, pressure-accumulation and water-injection apparatus, and nuclear installation2021 7,010,966'SPM cantilever and fabricating method thereof'2006 6,809,306'Scanning unit and scanning microscope having the same'2004 6,694,805'Cantilever for scanning probe microscopy'2004 6,617,761'Scanning unit and scanning microscope having the same'2003 6,246,054'Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls'2001 5,859,364'Scanning probe microscope'1999 5,835,251'Scanner system'1998 5,675,145'Scanning probe microscope having an optical system for enabling identification of the scanning region and sample observation during a scanning operation'1997 5,526,165'Scanner system'1996 5,386,720'Integrated AFM sensor'1995 5,386,110'Method of making cantilever chip for scanning probe microscope'1995 5,367,165'Cantilever chip for scanning probe microscope'1994 5,319,961'Cantilever chip for use in scanning probe microscope'1994 5,294,790'Probe unit for near-field optical scanning microscope'1994 5,289,408'Memory apparatus using tunnel current techniques'1994 5,272,913'Cantilever for a scanning probe microscope and a method of manufacturing the same'1993 5,264,696'Cantilever chip for scanning probe microscope having first and second probes formed with different aspect ratios'1993 5,253,515'Atomic probe microscope and cantilever unit for use in the microscope'1993 5,247,186'Integrated optical displacement sensor'1993 5,216,254'Circuit pattern forming apparatus using MU-STM'1993 5,150,234'Imaging apparatus having electrooptic devices comprising a variable focal length lens'1992 5,144,581'Apparatus including atomic probes utilizing tunnel current to read, write and erase data'1992 5,136,162'Measuring device in a scanning probe microscope'1992 5,097,352'Optical system including liquid crystal devices'1992 5,091,880'Memory device'1992 5,071,229'Imaging apparatus having electrooptic devices which comprise a variable focal length lens'1991 5,053,995'Tunnel current data storage apparatus having separate lever bodies'1991 5,047,637'Atomic probe type microscope apparatus'1991 5,047,847'Endoscope using liquid crystal devices different in the response frequency in the image forming optical system'1991 5,004,902'Focused point detecting optical system'1991 4,971,445'Fine surface profile measuring apparatus'1990 4,904,063'Liquid crystal lenses having a Fresnel lens'1990 4,781,440'Stereoscopic optical instruments utilizing liquid crystal'1988 4,743,800'Array of light emitting elements for electrophotographic printer'1988 4,604,337'Electrophotographic color copying paper and copying method making use of the same'1986 4,578,332'Method of removing electrostatic charge from electrophotographic photosensitive device'1986 4,565,436'Electrophotographic copying process'1986 4,546,722'Developing apparatus for electrophotographic copying machines'1985 4,537,846'Multiconductive layer electrophotographic photosensitive device and method of manufacture thereof'1985 4,537,845'Multiconductive layer electrophotographic photosensitive device and method of manufacture thereof'1985 4,526,848'Electrophotographic process with a.c. charger producing greater positive charge'1985 4,492,745'Photosensitive member for electrophotography with mirror finished support'1985

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1985–2004Patents assigned to OLYMPUS OPTICAL CO (41)· patent assignee history

1985–1990Based in Hachioji, JP· patent location history

1990–2021Based in Tokyo, JP· patent location history

1991–2006Based in Kunitachi, JP· patent location history

2003–2004Patents assigned to ANDO TOSHIO (2)· patent assignee history

2021Patents assigned to MITSUBISHI HEAVY IND LTD (2)· patent assignee history

2021Patents assigned to NIDEC CORP (2)· patent assignee history

2021Patents assigned to HONDA MOTOR CO LTD (1)· patent assignee history

2021Based in Kyoto, JP· patent location history

2021Based in Wako, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees

Assignee	Patents	Span
OLYMPUS OPTICAL CO	41	1985–2004
ANDO TOSHIO	2	2003–2004
MITSUBISHI HEAVY IND LTD	2	2021
NIDEC CORP	2	2021
HONDA MOTOR CO LTD	1	2021

Locations

Location	Patents	Span
Kunitachi, JP	19	1991–2006
Tokyo, JP	13	1990–2021
Hachioji, JP	11	1985–1990
Kyoto, JP	2	2021
Wako, JP	1	2021