Inventor

Yutaka Tamiya

Inventor
Kawasaki, JP

Overview

21→
Patents
1997–2021
Patent span
Physics
Primary field (CPC G)

Patents· 21 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G06Fprimary
G06FElectric digital data processing53%
G01RMeasuring electric variables20%
H04LTransmission of digital information, e.g. telegraphic communication7%
A61BDiagnosis3%
G01CMeasuring distances, levels or bearings3%
G06KGraphical data reading3%
G06TImage data processing or generation, in general3%
H03KPulse technique3%
Y02DClimate change mitigation technologies in information and communication technologies [ict], i.e. information and communication technologies aiming at the reduction of their own energy use3%
PatentTitleYear
11,086,679Determine whether to accelerate a process of a program based on characteristic values associated with strongly connected graphs202111,068,632Simulation apparatus, description conversion method and simulation method202111,062,066Information processing apparatus, computer-readable recording medium, and information processing method202110,754,658Information processing apparatus, information processing method, and computer-readable recording medium202010,024,911Debug circuit, semiconductor device, and debug method20189,857,423'Debugging circuit, debugger device, and debugging method'20189,753,084'Debug circuit, semiconductor device, and debug method'20179,720,037'Debug circuit, semiconductor device, and debug method'20179,602,095'Multiplexer circuit, computer-readable recording medium having stored therein program for designing multiplexer circuit, and apparatus for designing multiplexer circuit'20179,339,205'Waveform analyzer and waveform analysis method'20168,949,019'Communication device, mobile terminal, medium, information generation method, and system'20158,832,636'Verification support computer product, apparatus, and method'20148,671,372'Verification support computer product, apparatus, and method'20148,621,295'Circuit module, semiconductor integrated circuit, and inspection apparatus and method thereof'20138,448,172'Controlling parallel execution of plural simulation programs'20138,364,448'Model generating method and device and recording medium'20138,171,496'Program evaluation program, program evaluation device, and program evaluation method'20128,095,353'Power index computing apparatus, method of computing power index, and computer product'20128,065,643'Verification support apparatus, verification support method, and computer product'20117,536,620'Method of and apparatus for validation support, computer product for validation support'20095,659,486'Network analyzing method'1997

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1997–2021Patents assigned to FUJITSU LTD (20)· patent assignee history
1997–2016Based in Kawasaki, JP· patent location history
2011–2016Patents assigned to TAMIYA YUTAKA (9)· patent assignee history
2014–2015Patents assigned to OISHI RYOSUKE (2)· patent assignee history
2014–2015Patents assigned to THACH DAVID (2)· patent assignee history
2017Patents assigned to FUJITSU LIMTIED (1)· patent assignee history
2017–2021Based in Yokohama, JP· patent location history
2021Based in Yokohama-shi, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
FUJITSU LTD201997–2021
TAMIYA YUTAKAself92011–2016
OISHI RYOSUKE22014–2015
THACH DAVID22014–2015
FUJITSU LIMTIED12017
Locations
LocationPatentsSpan
Kawasaki, JP121997–2016
Yokohama, JP82017–2021
Yokohama-shi, JP12021