Inventor
Talion Edwards
Inventor
Wentzville, MO, US
Overview
Patents· 5 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties31%
G01VGeophysics31%
H05GX-ray technique23%
G01BMeasuring length, thickness or similar linear dimensions8%
G01CMeasuring distances, levels or bearings8%
PatentTitleYear
10,613,041System and method for quantifying x-ray backscatter system performance202010,436,724System and method for quantifying X-ray backscatter system performance20199,398,676'System and method for quantifying X-ray backscatter system performance'20168,224,121'System and method for assembling substantially distortion-free images'20127,463,714'Foreign object detection'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2020Patents assigned to BOEING CO (5)· patent assignee history
2008–2012Based in Foristell, MO, US· patent location history
2012Patents assigned to EDWARDS TALION (1)· patent assignee history
2012Patents assigned to FINLAYSON JOHN W (1)· patent assignee history
2012Patents assigned to GEORGESON GARY E (1)· patent assignee history
2012Patents assigned to SAFAI MORTEZA (1)· patent assignee history
2016–2019Based in Wentzville, MO, US· patent location history
2020Based in Wentzille, MO, US· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| BOEING CO | 5 | 2008–2020 |
| EDWARDS TALIONself | 1 | 2012 |
| FINLAYSON JOHN W | 1 | 2012 |
| GEORGESON GARY E | 1 | 2012 |
| SAFAI MORTEZA | 1 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Wentzville, MO, US | 2 | 2016–2019 |
| Foristell, MO, US | 2 | 2008–2012 |
| Wentzille, MO, US | 1 | 2020 |