Inventor
Yasuhiro Goshoo
Inventor
Tokyo, JP
Overview
Patents· 9 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties22%
B01JChemical or physical processes, e.g. catalysis or colloid chemistry17%
B01LChemical or physical laboratory apparatus for general use17%
C40BCombinatorial chemistry11%
G01LMeasuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure11%
C12QMeasuring or testing processes involving enzymes, nucleic acids or microorganisms6%
F01KSteam engine plants6%
H10DInorganic electric semiconductor devices6%
Y10TTechnical subjects covered by former us classification6%
PatentTitleYear
9,632,028'Dryness measurement device'20179,625,384'Dryness fraction distribution measuring device and dryness fraction distribution measuring method'20179,372,153'Dryness fraction distribution measuring device and dryness fraction distribution measuring method'20168,287,939'Method for manufacturing substrate for biochip'20128,198,071'Substrate for biochip, biochip, method for manufacturing substrate for biochip, and method for manufacturing biochip'20127,807,105'Substrate for biochip'20106,808,920'Microchip device for chemotaxis observation'20046,619,133'Semiconductor pressure sensor and its manufacturing method'20035,675,086'Electrostatic capacity-type pressure sensor'1997Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1997Based in Fujisawa, JP· patent location history
2003–2010Patents assigned to YAMATAKE CORP (3)· patent assignee history
2003–2017Based in Tokyo, JP· patent location history
2012–2017Patents assigned to AZBIL CORP (5)· patent assignee history
2012Patents assigned to GOSHOO YASUHIRO (2)· patent assignee history
2012Patents assigned to ISHIKAWA NAOHIRO (2)· patent assignee history
2012Patents assigned to KUROIWA TAKAAKI (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| AZBIL CORP | 5 | 2012–2017 |
| YAMATAKE CORP | 3 | 2003–2010 |
| GOSHOO YASUHIROself | 2 | 2012 |
| ISHIKAWA NAOHIRO | 2 | 2012 |
| KUROIWA TAKAAKI | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| Tokyo, JP | 8 | 2003–2017 |
| Fujisawa, JP | 1 | 1997 |