LexDanaLexDanabeta
Inventor

Sadaharu Arita

Inventor
Kure, JP

Overview

2→
Patents
2014
Patent span
Physics
Primary field (CPC G)

Patents· 2 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions100%
PatentTitleYear
8,654,351'Offset amount calibrating method and surface profile measuring machine'20148,650,939'Surface texture measuring machine and a surface texture measuring method'2014

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2014Patents assigned to ARITA SADAHARU (2)· patent assignee history
2014Patents assigned to FUKUMOTO YASUSHI (2)· patent assignee history
2014Patents assigned to HIRANO KOTARO (2)· patent assignee history
2014Patents assigned to KOMATSU KOICHI (2)· patent assignee history
2014Patents assigned to MITUTOYO CORP (2)· patent assignee history
2014Based in Kure, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
ARITA SADAHARUself22014
FUKUMOTO YASUSHI22014
HIRANO KOTARO22014
KOMATSU KOICHI22014
MITUTOYO CORP22014
Locations
LocationPatentsSpan
Kure, JP22014