Inventor
Masaaki Nojiri
Inventor
Hitachinaka, JP
Overview
Patents· 7 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Nprimary
G01NInvestigating or analysing materials by determining their chemical or physical properties36%
G06TImage data processing or generation, in general36%
H01JElectric discharge tubes or discharge lamps18%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h109%
PatentTitleYear
8,421,010'Charged particle beam device for scanning a sample using a charged particle beam to inspect the sample'20138,134,697'Inspection apparatus for inspecting patterns of substrate'20128,036,447'Inspection apparatus for inspecting patterns of a substrate'20117,696,487'Circuit pattern inspection apparatus'20107,532,328'Circuit-pattern inspection apparatus'20097,292,327'Circuit-pattern inspection apparatus'20077,223,975'Inspection apparatus for circuit pattern'2007Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2007–2013Patents assigned to HITACHI HIGH TECH CORP (7)· patent assignee history
2007–2013Based in Hitachinaka, JP· patent location history
2012–2013Patents assigned to NOJIRI MASAAKI (2)· patent assignee history
2012Patents assigned to HAYAKAWA KOICHI (1)· patent assignee history
2013Patents assigned to GUNJI YASUHIRO (1)· patent assignee history
2013Patents assigned to HIROI TAKASHI (1)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI HIGH TECH CORP | 7 | 2007–2013 |
| NOJIRI MASAAKIself | 2 | 2012–2013 |
| GUNJI YASUHIRO | 1 | 2013 |
| HAYAKAWA KOICHI | 1 | 2012 |
| HIROI TAKASHI | 1 | 2013 |
Locations
| Location | Patents | Span |
|---|---|---|
| Hitachinaka, JP | 7 | 2007–2013 |