Inventor
Hidemitsu Asano
Inventor
Kawasaki, JP
Overview
Patents· 15 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Bprimary
G01BMeasuring length, thickness or similar linear dimensions31%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
G06TImage data processing or generation, in general9%
B29CShaping or joining of plastics6%
B33YAdditive manufacturing, i.e. manufacturing of three-dimensional [3d] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3d printing, stereolithography or selective laser sintering6%
G05BControl or regulating systems in general6%
H04WWireless communication networks6%
B23KSoldering or unsoldering3%
G01JMeasurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light3%
G02BOptical elements, systems or apparatus3%
PatentTitleYear
11,089,483Shared frequency management apparatus and shared frequency management method202111,076,339Wireless communication system, wireless communication method, and base station202111,057,124Wireless communication system, wireless communication apparatus and directivity determination method202110,753,887X-ray CT measuring apparatus and interference prevention method thereof202010,618,220Object-forming machine, cross-section measurement apparatus, and cross-section measurement method202010,343,334Object-forming machine, cross-section measurement apparatus, and cross-section measurement method201910,295,337Surface texture measuring apparatus201910,190,996Method and device for controlling rotary table201910,102,631Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program20188,891,090'Light-interference measuring apparatus'20148,681,341'Shape measuring method and shape measuring apparatus'20148,680,428'Slit width adjusting device and microscope laser processing apparatus'20148,316,553'Coordinate measuring machine'20128,008,610'Illumination light quantity setting method in image measuring instrument'20117,420,588'Measuring method, measuring system and storage medium'2008Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2008–2020Patents assigned to MITUTOYO CORP (12)· patent assignee history
2008–2020Based in Kawasaki, JP· patent location history
2012–2014Patents assigned to ASANO HIDEMITSU (4)· patent assignee history
2014Patents assigned to MIYAKURA JYOTA (2)· patent assignee history
2014Patents assigned to GOTO TOMONORI (1)· patent assignee history
2019–2021Based in Kanagawa, JP· patent location history
2021Patents assigned to PANASONIC IP MAN CO LTD (3)· patent assignee history
2021Based in Yokohama-shi, Kanagawa, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| MITUTOYO CORP | 12 | 2008–2020 |
| ASANO HIDEMITSUself | 4 | 2012–2014 |
| PANASONIC IP MAN CO LTD | 3 | 2021 |
| MIYAKURA JYOTA | 2 | 2014 |
| GOTO TOMONORI | 1 | 2014 |
Locations
| Location | Patents | Span |
|---|---|---|
| Kawasaki, JP | 9 | 2008–2020 |
| Kanagawa, JP | 4 | 2019–2021 |
| Yokohama-shi, Kanagawa, JP | 2 | 2021 |