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Inventor

Gaku Kamitani

Inventor
Kyoto, JP

Overview

44→
Patents
2000–2020
Patent span
Electricity
Primary field (CPC H)

Patents· 44 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables22%
F04BPositive-displacement machines for liquids13%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution9%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy8%
H02JElectric power networks5%
H10NElectric solid-state devices not otherwise provided for5%
Y10TTechnical subjects covered by former us classification4%
F04DNon-positive-displacement pumps2%
F05BIndexing scheme relating to wind, spring, weight, inertia or like motors, to machines or engines for liquids covered by subclasses f03b, f03d and f03g2%
F16KValves2%
PatentTitleYear
10,855,198Power supply apparatus including AC-DC converters connected in parallel and driven based on load current202010,780,793Power storage system, transfer mechanism, transport mechanism, vehicle, and automobile202010,720,676Power storage pack having first and second power storage packs connected in parallel202010,547,202Power supplying system202010,084,215Battery pack20189,777,974'Cooling device and heating and cooling apparatus'20179,775,526'Blood pressure meter and pump driving system'20179,714,651'Vibrating device and piezoelectric pump'20179,574,674'Valve, fluidic apparatus, and fluid-supplying apparatus'20179,482,221'Gas control apparatus'20169,052,021'Valve, fluidic apparatus, and fluid-supplying apparatus'20158,684,707'Piezoelectric microblower'20148,678,787'Piezoelectric micro-blower'20148,508,104'Piezoelectric actuator driver circuit'20138,454,327'Piezoelectric micropump'20138,423,868'Method for correcting high-frequency characteristic error of electronic component'20138,314,531'Piezoelectric actuator driver circuit'20128,308,454'Fluid conveyance device'20128,287,253'Fluid conveyance device'20128,283,836'Piezoelectric actuator driver circuit'20128,162,629'Piezoelectric pump'20128,066,494'Micropump'20117,972,124'Piezoelectric micro-blower'20117,885,779'Measurement error correcting method and electronic component characteristic measurement device'20117,592,818'Method and apparatus for measuring scattering coefficient of device under test'20097,540,885'Method of processing a ceramic capacitor'20097,466,283'Coil antenna structure and portable electronic apparatus'20087,439,748'Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics'20087,405,576'Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics'20087,375,534'Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics'20086,960,920'Method for correcting measurement error and electronic component characteristic measurement apparatus'20056,956,391'Testing method for electronic component and testing device'20056,919,733'Electronic component production method and burn-in apparatus'20056,876,935'Method for correcting measurement error, method of determining quality of electronic component, and device for measuring characteristic of electronic component'20056,838,885'Method of correcting measurement error and electronic component characteristic measurement apparatus'20056,697,749'Correction method of measurement errors, quality checking method for electronic components, and characteristic measuring system of electronic components'20046,674,295'Impedance measuring apparatus for electronic component'20046,639,410'Insulation resistance measuring apparatus for capacitive electronic parts'20036,518,777'Method and apparatus for measuring insulation resistance'20036,456,087'Insulation resistance measuring apparatus for capacitive electronic parts'20026,384,609'Method of measuring insulation resistance of capacitors'20026,285,193'Method of measuring insulation resistance of capacitor and apparatus for screening characteristics'20016,184,688'Method of measuring insulation resistance of capacitor and apparatus for screening characteristics'20016,127,828'Apparatus for measuring resistance of electronic component'2000

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

2000–2020Patents assigned to MURATA MANUFACTURING CO (44)· patent assignee history
2000–2004Based in Otsu, JP· patent location history
2002–2003Based in Shiga, JP· patent location history
2004–2017Based in Kyoto, JP· patent location history
2011–2017Patents assigned to KAMITANI GAKU (13)· patent assignee history
2011–2017Patents assigned to HIRATA ATSUHIKO (7)· patent assignee history
2012–2014Patents assigned to KANAI SHUNGO (3)· patent assignee history
2012–2013Patents assigned to TABATA TOSHINARI (3)· patent assignee history
2014–2020Based in Nagaokakyo, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
MURATA MANUFACTURING CO442000–2020
KAMITANI GAKUself132011–2017
HIRATA ATSUHIKO72011–2017
KANAI SHUNGO32012–2014
TABATA TOSHINARI32012–2013
Locations
LocationPatentsSpan
Kyoto, JP252004–2017
Nagaokakyo, JP112014–2020
Otsu, JP62000–2004
Shiga, JP22002–2003