Inventor
ZHONGWEI CHEN
Inventor
US
Overview
Patents· 42 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H01Jprimary
H01JElectric discharge tubes or discharge lamps53%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
H01MProcesses or means, e.g. batteries, for the direct conversion of chemical energy into electrical energy6%
Y02EReduction of greenhouse gas [ghg] emissions, related to energy generation, transmission or distribution6%
B08BCleaning in general3%
G06NComputing arrangements based on specific computational models3%
G06TImage data processing or generation, in general3%
Y02ATechnologies for adaptation to climate change3%
A61LMethods or apparatus for sterilising materials or objects in general2%
C01BNon-metallic elements2%
PatentTitleYear
D1112859Pool light202612,524,933Pharmaceutical hyperspectral reconstruction method based on coded aperture snapshot spectral imaging system202612,494,342Systems and methods for charged particle flooding to enhance voltage contrast defect signal202512,482,831Nitrogen-doped graphitized carbon material and preparation method202512,469,668Systems and methods for compensating dispersion of a beam separator in a single-beam or multi-beam apparatus202512,424,408Apparatus of plural charged-particle beams202512,341,150Quasi-solid-state electrolyte composite based on three-dimensionally ordered macroporous metal-organic framework materials for lithium secondary battery and method for manufacturing the same202512,341,185Aqueous zinc lithium-ion battery and method for making same202512,300,458Objective lens system for fast scanning large FOV202512,249,114Stripe image processing method and apparatus for camera optical communication202512,237,143Apparatus of plural charged-particle beams202512,191,109Sample pre-charging methods and apparatuses for charged particle beam inspection202512,087,541Apparatus of plural charged-particle beams202411,935,720Field-emission type electron source and charged particle beam device using the same202411,929,232Systems and methods for charged particle flooding to enhance voltage contrast defect signal202411,887,807Apparatus of plural charged-particle beams202411,854,762MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the same202311,854,763Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof202311,848,169Field-emission type electron source and charged particle beam device using the same202311,837,431Objective lens system for fast scanning large FOV202311,798,777Charged particle beam apparatus, and systems and methods for operating the apparatus202311,784,024Multi-cell detector for charged particles202311,715,619Method and apparatus for charged particle detection202311,705,304Apparatus of plural charged-particle beams202311,688,580Apparatus of plural charged-particle beams202311,676,792Sample pre-charging methods and apparatuses for charged particle beam inspection202311,664,189Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereof202311,664,186Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interaction202311,593,938Rapid and automatic virus imaging and analysis system as well as methods thereof202311,587,758Apparatus of plural charged-particle beams202311,569,059Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereof202311,443,915Detection of buried features by backscattered particles202211,398,368Apparatus of plural charged-particle beams202211,355,312Stage driving system and apparatus or device such as apparatus of charged-particle beam comprising the same202211,328,894Systems and methods for compensating dispersion of a beam separator in a single-beam or multi-beam apparatus202211,328,898Digital detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof202211,295,927Apparatus of charged-particle beam such as electron microscope comprising co-condensers for continuous image resolution tuning202211,295,930Method and apparatus for charged particle detection202211,257,659Electrode assembly, electronic apparatus/device using the same, and apparatus of charged-particle beam such as electron microscope using the same202211,225,418Method of preparing carbon-graphene-lead composite particles202211,217,423Apparatus of plural charged-particle beams202211,201,032Electron emitter and method of fabricating same2021Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2021–2025Patents assigned to ASML NETHERLANDS BV (23)· patent assignee history
2021–2025Based in US· patent location history
2022–2026Patents assigned to CHEN ZHONGWEI (10)· patent assignee history
2022–2023Patents assigned to BORRIES PTE LTD (9)· patent assignee history
2022–2023Patents assigned to CHEN XIAOMING (6)· patent assignee history
2022–2023Patents assigned to FAN LIANG FU (6)· patent assignee history
2022–2025Based in CA· patent location history
2025–2026Based in CN· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| ASML NETHERLANDS BV | 23 | 2021–2025 |
| CHEN ZHONGWEIself | 10 | 2022–2026 |
| BORRIES PTE LTD | 9 | 2022–2023 |
| CHEN XIAOMING | 6 | 2022–2023 |
| FAN LIANG FU | 6 | 2022–2023 |
Locations
| Location | Patents | Span |
|---|---|---|
| US | 35 | 2021–2025 |
| CN | 5 | 2025–2026 |
| CA | 2 | 2022–2025 |