Inventor
Justin W. Wong
Inventor
South Burlington, VT, US
Overview
Patents· 25 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
H10Pprimary
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
C23CCoating metallic material15%
B24BMachines, devices, or processes for grinding or polishing13%
G01NInvestigating or analysing materials by determining their chemical or physical properties13%
G05BControl or regulating systems in general11%
G03FPhotomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices9%
Y02PClimate change mitigation technologies in the production or processing of goods6%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests4%
G01MTesting static or dynamic balance of machines or structures2%
G06FElectric digital data processing2%
PatentTitleYear
8,634,949'Manufacturing management using tool operating data'20148,260,034'Multi-modal data analysis for defect identification'20128,233,494'Hierarchical and incremental multivariate analysis for process control'20128,140,301'Method and system for causal modeling and outlier detection'20127,864,502'In situ monitoring of wafer charge distribution in plasma processing'20117,835,814'Tool for reporting the status and drill-down of a control application in an automated manufacturing environment'20107,805,639'Tool to report the status and drill-down of an application in an automated manufacturing environment'20107,793,162'Method for reporting the status and drill-down of a control application in an automated manufacturing environment'20107,493,236'Method for reporting the status of a control application in an automated manufacturing environment'20097,115,210'Measurement to determine plasma leakage'20066,121,064'STI fill for SOI which makes SOI inspectable'20005,788,801'Real time measurement of etch rate during a chemical etching process'19985,728,222'Apparatus for chemical vapor deposition of aluminum oxide'19985,665,608'Method of aluminum oxide low pressure chemical vapor deposition (LPCVD) system-fourier transform infrared (FTIR) source chemical control'19975,648,113'Aluminum oxide LPCVD system'19975,614,247'Apparatus for chemical vapor deposition of aluminum oxide'19975,582,746'Real time measurement of etch rate during a chemical etching process'19965,573,624'Chemical etch monitor for measuring film etching uniformity during a chemical etching process'19965,540,777'Aluminum oxide LPCVD system'19965,516,399'Contactless real-time in-situ monitoring of a chemical etching'19965,501,766'Minimizing overetch during a chemical etching process'19965,500,073'Real time measurement of etch rate during a chemical etching process'19965,489,361'Measuring film etching uniformity during a chemical etching process'19965,431,734'Aluminum oxide low pressure chemical vapor deposition (LPCVD) system-fourier transform infrared (FTIR) source chemical control'19955,425,810'Removable gas injectors for use in chemical vapor deposition of aluminium oxide'1995Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1995–2014Patents assigned to IBM (25)· patent assignee history
1995–2014Based in South Burlington, VT, US· patent location history
1996–1998Based in Chittenden County, VT, US· patent location history
1996–2000Based in Burlington, VT, US· patent location history
2012Patents assigned to WONG JUSTIN WAI-CHOW (3)· patent assignee history
2012Patents assigned to AMINI LISA (2)· patent assignee history
2012Patents assigned to TURAGA DEEPAK S (2)· patent assignee history
2012Patents assigned to VERSCHEURE OLIVIER (2)· patent assignee history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IBM | 25 | 1995–2014 |
| WONG JUSTIN WAI-CHOWself | 3 | 2012 |
| AMINI LISA | 2 | 2012 |
| TURAGA DEEPAK S | 2 | 2012 |
| VERSCHEURE OLIVIER | 2 | 2012 |
Locations
| Location | Patents | Span |
|---|---|---|
| South Burlington, VT, US | 18 | 1995–2014 |
| Chittenden County, VT, US | 4 | 1996–1998 |
| Burlington, VT, US | 3 | 1996–2000 |