Inventor
Tadanobu Toba
Inventor
Yokohama, JP
Overview
Patents· 19 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G06Fprimary
G06FElectric digital data processing29%
G01RMeasuring electric variables20%
G01NInvestigating or analysing materials by determining their chemical or physical properties9%
G06TImage data processing or generation, in general9%
H03KPulse technique9%
G11CStatic stores6%
H01JElectric discharge tubes or discharge lamps6%
G05BControl or regulating systems in general3%
G09GArrangements or circuits for control of indicating devices using static means to present variable information3%
H01LSemiconductor devices3%
PatentTitleYear
10,747,920Semiconductor LSI design device and design method202010,438,383Display device201910,401,424Soft error rate calculation device and calculation method for semiconductor large scale integration (LSI)201910,339,242Semiconductor LSI design device and design method201910,095,570Programmable device, error storage system, and electronic system device20189,933,475Semiconductor device and multi-chip module20189,735,784'Programmable logic device and logic integration tool'20179,645,871'Soft-error-rate calculating device'20179,507,895'Simulation apparatus and simulation method for determining soft error rates for a configured model'20169,489,324'Data processing device, semiconductor external view inspection device, and data volume increase alleviation method'20168,904,233'Electronic apparatus'20148,892,967'Measurement device and measurement method'20148,385,627'Method and apparatus for inspecting defects of semiconductor device'20138,304,726'Test apparatus'20128,032,332'Semiconductor inspecting apparatus'20117,952,072'Test apparatus'20117,870,428'Method of diagnosing circuit board, circuit board, and CPU unit'20117,137,055'Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory'20067,114,110'Semiconductor device, and the method of testing or making of the semiconductor device'2006Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
2006–2016Based in Yokohama, JP· patent location history
2011–2020Patents assigned to HITACHI LTD (12)· patent assignee history
2011–2016Patents assigned to HITACHI HIGH TECH CORP (5)· patent assignee history
2012–2016Patents assigned to TOBA TADANOBU (5)· patent assignee history
2014–2016Patents assigned to IBE HIDEFUMI (3)· patent assignee history
2014–2016Patents assigned to SHIMBO KENICHI (2)· patent assignee history
2016–2020Based in Tokyo, JP· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| HITACHI LTD | 12 | 2011–2020 |
| HITACHI HIGH TECH CORP | 5 | 2011–2016 |
| TOBA TADANOBUself | 5 | 2012–2016 |
| IBE HIDEFUMI | 3 | 2014–2016 |
| SHIMBO KENICHI | 2 | 2014–2016 |
Locations
| Location | Patents | Span |
|---|---|---|
| Yokohama, JP | 10 | 2006–2016 |
| Tokyo, JP | 9 | 2016–2020 |