Inventor
Wilfried Vandervorst
Inventor
Mechelen, BE
Overview
Patents· 26 as inventor
Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.
G01Qprimary
G01QScanning-probe techniques or apparatus21%
Y10STechnical subjects covered by former uspc cross-reference art collections [xracs] and digests18%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1014%
G01RMeasuring electric variables11%
B82YSpecific uses or applications of nanostructures9%
G01NInvestigating or analysing materials by determining their chemical or physical properties8%
H01LSemiconductor devices6%
H01JElectric discharge tubes or discharge lamps5%
H10DInorganic electric semiconductor devices5%
H10FInorganic semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation3%
PatentTitleYear
11,125,805Device for measuring surface characteristics of a material202110,746,759Method for determining the shape of a sample tip for atom probe tomography202010,541,108Method and apparatus for transmission electron microscopy202010,495,666Device and method for two dimensional active carrier profiling of semiconductor components201910,014,178Method for differential heating of elongate nano-scaled structures20189,612,258'Probe configuration and method of fabrication thereof'20179,588,137'Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-up'20178,872,230'Tunnel field-effect transistor and methods for manufacturing thereof'20148,717,570'Method for determining the active doping concentration of a doped semiconductor region'20148,484,761'Method for cost-efficient manufacturing diamond tips for ultra-high resolution electrical measurements and devices obtained thereof'20138,232,517'Wavelength-sensitive detector comprising photoconductor units each having different types of elongated nanostructures'20128,211,812'Method for fabricating a high-K dielectric layer'20127,598,482'Wavelength-sensitive detector with elongate nanostructures'20097,133,128'System and method for measuring properties of a semiconductor substrate in a non-destructive way'20066,823,723'Method and apparatus for performing atomic force microscopy measurements'20046,809,317'Method and apparatus for local surface analysis'20046,756,584'Probe tip and method of manufacturing probe tips by peel-off'20046,690,008'Probe and method of manufacturing mounted AFM probes'20046,504,152'Probe tip configuration and a method of fabrication thereof'20036,328,902'Probe tip configuration and a method of fabrication thereof'20016,201,401'Method for measuring the electrical potential in a semiconductor element'20016,091,248'Method for measuring the electrical potential in a semiconductor element'20005,995,912'Database and method for measurement correction for cross-sectional carrier profiling techniques'19995,723,981'Method for measuring the electrical potential in a semiconductor element'19985,585,734'Method for determining the resistance and carrier profile of a semiconductor element using a scanning proximity microscope'19965,369,372'Method for resistance measurements on a semiconductor element with controlled probe pressure'1994Career & activity timeline
Assembled from patent assignee/location history and declaration credentials.
1994–2006Patents assigned to IMEC INTER UNI MICRO ELECTR (7)· patent assignee history
1994–2021Based in Mechelen, BE· patent location history
1998–2021Patents assigned to IMEC VZW (10)· patent assignee history
2001–2017Patents assigned to IMEC (9)· patent assignee history
2012–2013Patents assigned to VANDERVORST WILFRIED (3)· patent assignee history
2014–2017Patents assigned to UNIV LEUVEN KATH (2)· patent assignee history
2014–2017Based in Leuven, BE· patent location history
Inventor activity
Assignee and location history derived from the patent record.
Assignees
| Assignee | Patents | Span |
|---|---|---|
| IMEC VZW | 10 | 1998–2021 |
| IMEC | 9 | 2001–2017 |
| IMEC INTER UNI MICRO ELECTR | 7 | 1994–2006 |
| VANDERVORST WILFRIEDself | 3 | 2012–2013 |
| UNIV LEUVEN KATH | 2 | 2014–2017 |
Locations
| Location | Patents | Span |
|---|---|---|
| Mechelen, BE | 23 | 1994–2021 |
| Leuven, BE | 3 | 2014–2017 |