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Inventor

Yoshihito Marumo

Inventor
Yamanashi, JP

Overview

4→
Patents
1992–2011
Patent span
Physics
Primary field (CPC G)

Patents· 4 as inventor

Public. Assignee & technology derived from the patent record. Each patent links to its LexDana page.

G01Rprimary
G01RMeasuring electric variables67%
G06TImage data processing or generation, in general17%
H10PGeneric processes or apparatus for the manufacture or treatment of devices covered by class h1017%
PatentTitleYear
7,991,219'Method and apparatus for detecting positions of electrode pads'20115,936,416'Probe inspection apparatus'19995,777,485'Probe method and apparatus with improved probe contact'19985,124,931'Method of inspecting electric characteristics of wafers and apparatus therefor'1992

Career & activity timeline

Assembled from patent assignee/location history and declaration credentials.

1992–2011Patents assigned to TOKYO ELECTRON LTD (4)· patent assignee history
1992Based in Kitakoma, JP· patent location history
1998–1999Based in Yamanashi, JP· patent location history
2011Based in Nirasaki, JP· patent location history

Inventor activity

Assignee and location history derived from the patent record.

Assignees
AssigneePatentsSpan
TOKYO ELECTRON LTD41992–2011
Locations
LocationPatentsSpan
Yamanashi, JP21998–1999
Nirasaki, JP12011
Kitakoma, JP11992